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Alexander Groholski
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Salem, MA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Charged particle beam system and method of operating a charged part...
Patent number
9,536,699
Issue date
Jan 3, 2017
Carl Zeiss Microscopy, LLC
John A. Notte
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Charged particle beam system and method of operating a charged part...
Patent number
9,530,612
Issue date
Dec 27, 2016
Carl Zeiss Microscopy, LLC
John A. Notte
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charged particle beam system and method of operating a charged part...
Patent number
9,530,611
Issue date
Dec 27, 2016
Carl Zeiss Microscopy, LLC
John A. Notte
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion sources, systems and methods
Patent number
9,029,765
Issue date
May 12, 2015
Carl Zeiss Microscopy, LLC
Richard Comunale
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion sources, systems and methods
Patent number
8,633,451
Issue date
Jan 21, 2014
Carl Zeiss Microscopy, LLC
Billy W. Ward
F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information
Patent Grant
Ion sources, systems and methods
Patent number
8,461,557
Issue date
Jun 11, 2013
Carl Zeiss Microscopy, LLC
Richard Comunale
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion sources, systems and methods
Patent number
7,786,451
Issue date
Aug 31, 2010
ALIS Corporation
Billy W. Ward
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion sources, systems and methods
Patent number
7,745,801
Issue date
Jun 29, 2010
ALIS Corporation
Billy W. Ward
Information
Patent Grant
Apparatus for tilting a beam system
Patent number
6,661,009
Issue date
Dec 9, 2003
FEI Company
Alexander Groholski
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...
Publication number
20150008332
Publication date
Jan 8, 2015
Carl Zeiss Microscopy, LLC
John A. Notte
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...
Publication number
20150008341
Publication date
Jan 8, 2015
Carl Zeiss Microscopy, LLC
John A. Notte
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CHARGED PARTICLE BEAM SYSTEM AND METHOD OF OPERATING A CHARGED PART...
Publication number
20150008342
Publication date
Jan 8, 2015
Carl Zeiss Microscopy, LLC
John A. Notte
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ION SOURCES, SYSTEMS AND METHODS
Publication number
20130256532
Publication date
Oct 3, 2013
Carl Zeiss Microscopy, LLC
Richard Comunale
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COOLED CHARGED PARTICLE SYSTEMS AND METHODS
Publication number
20130118184
Publication date
May 16, 2013
CARL ZEISS NTS, LLC.
Alexander Groholski
F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
Information
Patent Application
ION SOURCES, SYSTEMS AND METHODS
Publication number
20120241640
Publication date
Sep 27, 2012
CARL ZEISS NTS, LLC.
Billy W. Ward
F25 - REFRIGERATION OR COOLING COMBINED HEATING AND REFRIGERATION SYSTEMS HEA...
Information
Patent Application
ION SOURCES, SYSTEMS AND METHODS
Publication number
20110240853
Publication date
Oct 6, 2011
CARL ZEISS NTS, LLC.
Richard Comunale
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Ion sources, systems and methods
Publication number
20070158582
Publication date
Jul 12, 2007
Billy W. Ward
B82 - NANO-TECHNOLOGY