Alexander Guido Gronthoud

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Eindhoven, NL

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Patents Grantslast 30 patents

Information Patent Grant
Analog circuit testing and test pattern generation
- Patent number 8,122,423
- Issue date Feb 21, 2012
- NXP B.V.
- Amir Zjajo
- G01 - MEASURING TESTING
Information Patent Grant
Testing radio frequency and analogue circuits
- Patent number 7,539,589
- Issue date May 26, 2009
- NXP B.V.
- Jose De Jesus Pineda De Gyvez
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for testing a phase locked loop
- Patent number 7,477,110
- Issue date Jan 13, 2009
- NXP B.V.
- Jose De Jesus Pineda De Gyvez
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANALOG CIRCUIT TESTING AND TEST PATTERN GENERATION
- Publication number 20100109676
- Publication date May 6, 2010
- NXP, B.V.
- Amir Zjajo
- G01 - MEASURING TESTING
Information Patent Application
TESTABLE ELECTRONIC DEVICE FOR WIRELESS COMMUNICATION
- Publication number 20100049465
- Publication date Feb 25, 2010
- NXP, B.V.
- Jose De Jesus Pineda De Gyvez
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Testing radio frequency and analogue circuits
- Publication number 20070143643
- Publication date Jun 21, 2007
- Koninklijke Philips Electronics N.V.
- Jose De Jesus Pineda De Gyvez
- G01 - MEASURING TESTING
Information Patent Application
Method and device for testing a phase locked loop
- Publication number 20070132525
- Publication date Jun 14, 2007
- KONINKLIJKE PHILIPS ELECTRONICS N.C.
- Jose De Jesus Pineda de Gyvez
- H03 - BASIC ELECTRONIC CIRCUITRY