Alexander James Pasadyn

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Process control using analysis of an upstream process
- Patent number 8,615,314
- Issue date Dec 24, 2013
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Parallel fault detection
- Patent number 8,359,494
- Issue date Jan 22, 2013
- GLOBALFOUNDRIES Inc.
- Elfido Coss
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic adaptive sampling rate for model prediction
- Patent number 8,017,411
- Issue date Sep 13, 2011
- GLOBALFOUNDRIES, INC.
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Controlling processing of semiconductor wafers based upon end of li...
- Patent number 7,797,073
- Issue date Sep 14, 2010
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Initiating test runs based on fault detection results
- Patent number 7,581,140
- Issue date Aug 25, 2009
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Applying a self-adaptive filter to a drifting process
- Patent number 7,424,392
- Issue date Sep 9, 2008
- Advanced Micro Devices, Inc.
- Jin Wang
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Determining transmission of error effects for improving parametric...
- Patent number 7,117,062
- Issue date Oct 3, 2006
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for initializing tool controllers based on too...
- Patent number 7,103,439
- Issue date Sep 5, 2006
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for implementing competing control models
- Patent number 7,067,333
- Issue date Jun 27, 2006
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- G05 - CONTROLLING REGULATING
Information Patent Grant
Adaptive sampling method for improved control in semiconductor manu...
- Patent number 6,988,017
- Issue date Jan 17, 2006
- Advanced Micro Devices, Inc.
- Alexander James Pasadyn
- G05 - CONTROLLING REGULATING
Information Patent Grant
Matching data related to multiple metrology tools
- Patent number 6,978,189
- Issue date Dec 20, 2005
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for controlling a thickness of a conductive la...
- Patent number 6,969,672
- Issue date Nov 29, 2005
- Advanced Micro Devices, Inc.
- Joyce S. Obey Hewett
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for updating control state variables of a proc...
- Patent number 6,970,757
- Issue date Nov 29, 2005
- Advanced Micro Devices, Inc.
- Joyce S. Oey Hewett
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for dispatching based on metrology tool perfor...
- Patent number 6,968,252
- Issue date Nov 22, 2005
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for dynamically monitoring controller tuning p...
- Patent number 6,961,636
- Issue date Nov 1, 2005
- Advanced Micro Devices Inc.
- Robert J. Chong
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Dispatch and/or disposition of material based upon an expected para...
- Patent number 6,947,803
- Issue date Sep 20, 2005
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for controlling process target values based on...
- Patent number 6,937,914
- Issue date Aug 30, 2005
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Process control based on an estimated process result
- Patent number 6,925,347
- Issue date Aug 2, 2005
- Advanced Micro Devices, Inc.
- Michael L. Miller
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for predicting electrical parameters using mea...
- Patent number 6,917,849
- Issue date Jul 12, 2005
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining a next tool state based on fault detection information
- Patent number 6,912,433
- Issue date Jun 28, 2005
- Advanced Mirco Devices, Inc.
- Robert J. Chong
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for modifying design constraints based on obse...
- Patent number 6,907,369
- Issue date Jun 14, 2005
- Advanced Micro Devices, Inc.
- Richard J. Markle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for distinguishing between sources of process...
- Patent number 6,901,340
- Issue date May 31, 2005
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for controlling photolithography overlay regis...
- Patent number 6,897,075
- Issue date May 24, 2005
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and apparatus for determining a sampling plan based on proce...
- Patent number 6,821,792
- Issue date Nov 23, 2004
- Advanced Micro Devices, Inc.
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tuning of a process control based upon layer dependencies
- Patent number 6,823,231
- Issue date Nov 23, 2004
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for integrating multiple process controllers
- Patent number 6,801,817
- Issue date Oct 5, 2004
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus using integrated metrology data for pre-proces...
- Patent number 6,788,988
- Issue date Sep 7, 2004
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for adaptively scheduling tool maintenance
- Patent number 6,785,586
- Issue date Aug 31, 2004
- Advanced Micro Devices, Inc.
- Anthony J. Toprac
- G05 - CONTROLLING REGULATING
Information Patent Grant
Identifying a cause of a fault based on a process controller output
- Patent number 6,778,873
- Issue date Aug 17, 2004
- Advanced Micro Devices, Inc.
- Jin Wang
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Dynamic targeting for a process control system
- Patent number 6,773,931
- Issue date Aug 10, 2004
- Advanced Micro Devices, Inc.
- Alexander J. Pasadyn
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...

Patents Applicationslast 30 patents

Information Patent Application
Adaptive sampling method for improved control in semiconductor manu...
- Publication number 20050221514
- Publication date Oct 6, 2005
- Advanced Micro Devices, Inc.
- Alexander James Pasadyn
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for controlling photolithography overlay regis...
- Publication number 20040159397
- Publication date Aug 19, 2004
- Advanced Micro Devices, Inc.
- Christopher A. Bode
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Dynamic adaptive sampling rate for model prediction
- Publication number 20040121495
- Publication date Jun 24, 2004
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Parallel fault detection
- Publication number 20040123182
- Publication date Jun 24, 2004
- Elfido Cross
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Dynamic targeting for a process control system
- Publication number 20040029299
- Publication date Feb 12, 2004
- Alexander J. Pasadyn
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and apparatus for utilizing integrated metrology data as fee...
- Publication number 20030097198
- Publication date May 22, 2003
- Thomas J. Sonderman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for cascade control using integrated metrology
- Publication number 20030082837
- Publication date May 1, 2003
- Alexander J. Pasadyn
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for controlling feature critical dimensions ba...
- Publication number 20020177245
- Publication date Nov 28, 2002
- Thomas J. Sonderman
- G01 - MEASURING TESTING
Information Patent Application
Method of varying stepper exposure dose to compensate for across-wa...
- Publication number 20020106821
- Publication date Aug 8, 2002
- Christopher A. Bode
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Use of endpoint system to match individual processing stations wirh...
- Publication number 20020087229
- Publication date Jul 4, 2002
- Alexander J. Pasadyn
- G05 - CONTROLLING REGULATING

Alexander James Pasadyn

Person

Patents Grantslast 30 patents

Process control using analysis of an upstream process

Parallel fault detection

Dynamic adaptive sampling rate for model prediction

Controlling processing of semiconductor wafers based upon end of li...

Initiating test runs based on fault detection results

Applying a self-adaptive filter to a drifting process

Determining transmission of error effects for improving parametric...

Method and apparatus for initializing tool controllers based on too...

Method and apparatus for implementing competing control models

Adaptive sampling method for improved control in semiconductor manu...

Matching data related to multiple metrology tools

Method and apparatus for controlling a thickness of a conductive la...

Method and apparatus for updating control state variables of a proc...

Method and apparatus for dispatching based on metrology tool perfor...

Method and apparatus for dynamically monitoring controller tuning p...

Dispatch and/or disposition of material based upon an expected para...

Method and apparatus for controlling process target values based on...

Process control based on an estimated process result

Method and apparatus for predicting electrical parameters using mea...

Determining a next tool state based on fault detection information

Method and apparatus for modifying design constraints based on obse...

Method and apparatus for distinguishing between sources of process...

Method and apparatus for controlling photolithography overlay regis...

Method and apparatus for determining a sampling plan based on proce...

Tuning of a process control based upon layer dependencies

Method and apparatus for integrating multiple process controllers

Method and apparatus using integrated metrology data for pre-proces...

Method and apparatus for adaptively scheduling tool maintenance

Identifying a cause of a fault based on a process controller output

Dynamic targeting for a process control system

Patents Applicationslast 30 patents

Adaptive sampling method for improved control in semiconductor manu...

Method and apparatus for controlling photolithography overlay regis...

Dynamic adaptive sampling rate for model prediction

Parallel fault detection

Dynamic targeting for a process control system

Method and apparatus for utilizing integrated metrology data as fee...

Method and apparatus for cascade control using integrated metrology

Method and apparatus for controlling feature critical dimensions ba...

Method of varying stepper exposure dose to compensate for across-wa...

Use of endpoint system to match individual processing stations wirh...