Alexander Jozef Gubbens

Person

Redwood City, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Objective lens with deflector plates immersed in electrostatic lens...
- Patent number 8,698,093
- Issue date Apr 15, 2014
- KLA-Tencor Corporation
- Alexander J. Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Bright-field/dark-field detector with integrated electron energy sp...
- Patent number 7,755,043
- Issue date Jul 13, 2010
- KLA-Tencor Technologies Corporation
- Alexander J. Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for obtaining topographical dark-field images...
- Patent number 7,714,287
- Issue date May 11, 2010
- KLA-Tencor Corporation
- Edward M. James
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transverse magnetic field voltage isolator
- Patent number 7,612,348
- Issue date Nov 3, 2009
- KLA-Technologies Corporation
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-resolution auger electron spectrometer
- Patent number 7,560,691
- Issue date Jul 14, 2009
- KLA-Tencor Technologies Corporation
- Alexander J. Gubbens
- G01 - MEASURING TESTING
Information Patent Grant
Charge-control method and apparatus for electron beam imaging
- Patent number 7,488,938
- Issue date Feb 10, 2009
- KLA-Tencor Technologies Corporation
- Alexander Jozef Gubbens
- G01 - MEASURING TESTING
Information Patent Grant
Transverse magnetic field voltage isolator
- Patent number 7,394,339
- Issue date Jul 1, 2008
- KLA-Tencor Technologies Corporation
- Alexander Jozef Gubbens
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods and systems for preparing a copper containing substrate for...
- Patent number 7,148,073
- Issue date Dec 12, 2006
- KLA-Tencor Technologies Corp.
- David Soltz
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
SEM profile and surface reconstruction using multiple data sets
- Patent number 6,930,308
- Issue date Aug 16, 2005
- KLA-Tencor Technologies Corporation
- Gian Francesco Lorusso
- G01 - MEASURING TESTING

Alexander Jozef Gubbens

Person

Patents Grantslast 30 patents

Objective lens with deflector plates immersed in electrostatic lens...

Bright-field/dark-field detector with integrated electron energy sp...

Apparatus and method for obtaining topographical dark-field images...

Transverse magnetic field voltage isolator

High-resolution auger electron spectrometer

Charge-control method and apparatus for electron beam imaging

Transverse magnetic field voltage isolator

Methods and systems for preparing a copper containing substrate for...

SEM profile and surface reconstruction using multiple data sets