Alexander Kadyshevitch

Person

  • Modiin, IL

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    CONTACT OPENING METROLOGY

    • Publication number 20070257191
    • Publication date Nov 8, 2007
    • Alexander Kadyshevitch
    • G01 - MEASURING TESTING
  • Information Patent Application

    High current electron beam inspection

    • Publication number 20070057687
    • Publication date Mar 15, 2007
    • Alexander Kadyshevitch
    • G01 - MEASURING TESTING
  • Information Patent Application

    Contact opening metrology

    • Publication number 20060113471
    • Publication date Jun 1, 2006
    • Alexander Kadyshevitch
    • G01 - MEASURING TESTING
  • Information Patent Application

    Methodology and apparatus for leakage detection

    • Publication number 20050279935
    • Publication date Dec 22, 2005
    • Applied Materials Israel Ltd.
    • Dmirty Shur
    • G01 - MEASURING TESTING
  • Information Patent Application

    Contact opening metrology

    • Publication number 20050173657
    • Publication date Aug 11, 2005
    • Applied Materials,Inc
    • Alexander Kadyshevitch
    • G01 - MEASURING TESTING
  • Information Patent Application

    System and method for measuring overlay errors

    • Publication number 20050089773
    • Publication date Apr 28, 2005
    • Applied Materials Israel Ltd.
    • Dimitry Shur
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Specimen current mapper

    • Publication number 20040084622
    • Publication date May 6, 2004
    • Applied Materials Israel Ltd.
    • Alexander Kadyshevitch
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Contact opening metrology

    • Publication number 20040021076
    • Publication date Feb 5, 2004
    • Applied Materials Israel Ltd.
    • Alexander Kadyshevitch
    • G01 - MEASURING TESTING
  • Information Patent Application

    Auger-based thin film metrology

    • Publication number 20030146379
    • Publication date Aug 7, 2003
    • Applied Materials Israel, Inc.
    • Alexander Kadyshevitch
    • G01 - MEASURING TESTING
  • Information Patent Application

    Monitoring of contact hole production

    • Publication number 20030146381
    • Publication date Aug 7, 2003
    • Applied Materials Israel, Inc.
    • Avi Simon
    • H01 - BASIC ELECTRIC ELEMENTS