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Alexander Kadyshevitch
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Modiin, IL
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Patents Grants
last 30 patents
Information
Patent Grant
System and method for measuring overlay errors
Patent number
7,842,933
Issue date
Nov 30, 2010
Applied Materials Israel, Ltd.
Dimitry Shur
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
High current electron beam inspection
Patent number
7,602,197
Issue date
Oct 13, 2009
Applied Materials, Israel, Ltd.
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Grant
Contact opening metrology
Patent number
7,476,875
Issue date
Jan 13, 2009
Applied Materials, Israel, Ltd.
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Grant
Specimen current mapper
Patent number
7,473,911
Issue date
Jan 6, 2009
Applied Materials, Israel, Ltd.
Alexander Kadyshevitch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Contact opening metrology
Patent number
7,381,978
Issue date
Jun 3, 2008
Applied Materials, Israel, Ltd.
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Grant
Contact opening metrology
Patent number
7,279,689
Issue date
Oct 9, 2007
Applied Materials, Israel, Ltd.
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Grant
Methodology and apparatus for leakage detection
Patent number
7,170,056
Issue date
Jan 30, 2007
Applied Materials, Israel, Ltd.
Dmirty Shur
G01 - MEASURING TESTING
Information
Patent Grant
Monitoring of contact hole production
Patent number
7,078,690
Issue date
Jul 18, 2006
Applied Materials, Israel, Ltd.
Avi Simon
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Contact opening metrology
Patent number
7,038,224
Issue date
May 2, 2006
Applied Materials, Israel, Ltd.
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Grant
Auger-based thin film metrology
Patent number
6,781,126
Issue date
Aug 24, 2004
Applied Materials, Inc.
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Grant
System and method for automatic analysis of defect material on semi...
Patent number
6,407,386
Issue date
Jun 18, 2002
Applied Materials, Inc.
Noam Dotan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CONTACT OPENING METROLOGY
Publication number
20070257191
Publication date
Nov 8, 2007
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Application
High current electron beam inspection
Publication number
20070057687
Publication date
Mar 15, 2007
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Application
Contact opening metrology
Publication number
20060113471
Publication date
Jun 1, 2006
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Application
Methodology and apparatus for leakage detection
Publication number
20050279935
Publication date
Dec 22, 2005
Applied Materials Israel Ltd.
Dmirty Shur
G01 - MEASURING TESTING
Information
Patent Application
Contact opening metrology
Publication number
20050173657
Publication date
Aug 11, 2005
Applied Materials,Inc
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Application
System and method for measuring overlay errors
Publication number
20050089773
Publication date
Apr 28, 2005
Applied Materials Israel Ltd.
Dimitry Shur
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Specimen current mapper
Publication number
20040084622
Publication date
May 6, 2004
Applied Materials Israel Ltd.
Alexander Kadyshevitch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Contact opening metrology
Publication number
20040021076
Publication date
Feb 5, 2004
Applied Materials Israel Ltd.
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Application
Auger-based thin film metrology
Publication number
20030146379
Publication date
Aug 7, 2003
Applied Materials Israel, Inc.
Alexander Kadyshevitch
G01 - MEASURING TESTING
Information
Patent Application
Monitoring of contact hole production
Publication number
20030146381
Publication date
Aug 7, 2003
Applied Materials Israel, Inc.
Avi Simon
H01 - BASIC ELECTRIC ELEMENTS