Alexander Krechmer

Person

Ottawa, CA

People

Patents Grantslast 30 patents

Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,915,628
- Issue date Mar 13, 2018
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,529,040
- Issue date Dec 27, 2016
- TECHINSIGHTS INC.
- Christopher Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 9,383,327
- Issue date Jul 5, 2016
- TECHINSIGHTS INC.
- Chris Pawlowicz
- G01 - MEASURING TESTING
Information Patent Grant
Circuit tracing using a focused ion beam
- Patent number 8,791,436
- Issue date Jul 29, 2014
- Chris Pawlowicz
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for surface modification using charged particl...
- Patent number 8,552,406
- Issue date Oct 8, 2013
- Fibics Incorporated
- Michael William Phaneuf
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Methods for performing circuit edit operations with low landing ene...
- Patent number 8,466,415
- Issue date Jun 18, 2013
- Fibics Incorporated
- Michael William Phaneuf
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Apparatus and method for surface modification using charged particl...
- Patent number 7,893,397
- Issue date Feb 22, 2011
- Fibics Incorporated
- Michael William Phaneuf
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT TRACING USING A FOCUSED ION BEAM
- Publication number 20160282287
- Publication date Sep 29, 2016
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TRACING USING A FOCUSED ION BEAM
- Publication number 20160187419
- Publication date Jun 30, 2016
- TECHINSIGHTS INC.
- Christopher PAWLOWICZ
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TRACING USING A FOCUSED ION BEAM
- Publication number 20140319343
- Publication date Oct 30, 2014
- Chris Pawlowicz
- G01 - MEASURING TESTING
Information Patent Application
METHODS FOR PERFORMING CIRCUIT EDIT OPERATIONS WITH LOW LANDING ENE...
- Publication number 20110204263
- Publication date Aug 25, 2011
- FIBICS INCORPORATED
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR SURFACE MODIFICATION USING CHARGED PARTICL...
- Publication number 20110186719
- Publication date Aug 4, 2011
- FIBICS INCORPORATED
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and Method for Surface Modification Using Charged Particl...
- Publication number 20080302954
- Publication date Dec 11, 2008
- FIBICS INCORPORATED
- Michael William Phaneuf
- H01 - BASIC ELECTRIC ELEMENTS

Alexander Krechmer

Person

Patents Grantslast 30 patents

Circuit tracing using a focused ion beam

Circuit tracing using a focused ion beam

Circuit tracing using a focused ion beam

Circuit tracing using a focused ion beam

Apparatus and method for surface modification using charged particl...

Methods for performing circuit edit operations with low landing ene...

Apparatus and method for surface modification using charged particl...

Patents Applicationslast 30 patents

CIRCUIT TRACING USING A FOCUSED ION BEAM

CIRCUIT TRACING USING A FOCUSED ION BEAM

CIRCUIT TRACING USING A FOCUSED ION BEAM

METHODS FOR PERFORMING CIRCUIT EDIT OPERATIONS WITH LOW LANDING ENE...

APPARATUS AND METHOD FOR SURFACE MODIFICATION USING CHARGED PARTICL...

Apparatus and Method for Surface Modification Using Charged Particl...