Alexander Krohmal

Follow

Person

Haifa, IL

People

Patents Grantslast 30 patents

Information Patent Grant
High-resolution X-ray diffraction measurement with enhanced sensiti...
- Patent number 8,731,138
- Issue date May 20, 2014
- Jordan Valley Semiconductor Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector assembly with shield
- Patent number 8,693,635
- Issue date Apr 8, 2014
- Jordan Valley Semiconductor Ltd.
- Alexander Krohmal
- G01 - MEASURING TESTING
Information Patent Grant
Enhancing accuracy of fast high-resolution X-ray diffractometry
- Patent number 8,687,766
- Issue date Apr 1, 2014
- Jordan Valley Semiconductors Ltd.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution X-ray diffraction measurement with enhanced sensiti...
- Patent number 8,243,878
- Issue date Aug 14, 2012
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY DETECTOR ASSEMBLY WITH SHIELD
- Publication number 20130270447
- Publication date Oct 17, 2013
- Alexander Krohmal
- G01 - MEASURING TESTING
Information Patent Application
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...
- Publication number 20120281814
- Publication date Nov 8, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
ENHANCING ACCURACY OF FAST HIGH-RESOLUTION X-RAY DIFFRACTOMETRY
- Publication number 20120014508
- Publication date Jan 19, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Application
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...
- Publication number 20110164730
- Publication date Jul 7, 2011
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Boris Yokhin
- G01 - MEASURING TESTING