Alexander L. Flamholz

Person

Monsey, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray beam scanning method for producing low distortion or constant...
- Patent number 5,268,951
- Issue date Dec 7, 1993
- International Business Machines Corporation
- Alexander L. Flamholz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Segmented mask and exposure system for x-ray lithography
- Patent number 5,235,626
- Issue date Aug 10, 1993
- International Business Machines Corporation
- Alexander L. Flamholz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Defect detection in films on ceramic substrates
- Patent number 4,679,938
- Issue date Jul 14, 1987
- International Business Machines Corporation
- Alexander L. Flamholz
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for pellicalized reticles
- Patent number 4,637,714
- Issue date Jan 20, 1987
- International Business Machines Corporation
- Alexander L. Flamholz
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
High precision pattern registration and overlay measurement system...
- Patent number 4,172,664
- Issue date Oct 30, 1979
- International Business Machines Corporation
- Ronald S. Charsky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measuring method and system using a diffraction pattern
- Patent number 3,957,376
- Issue date May 18, 1976
- International Business Machines Corporation
- Ronald S. Charsky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Alexander L. Flamholz

Person

Patents Grantslast 30 patents

X-ray beam scanning method for producing low distortion or constant...

Segmented mask and exposure system for x-ray lithography

Defect detection in films on ceramic substrates

Inspection system for pellicalized reticles

High precision pattern registration and overlay measurement system...

Measuring method and system using a diffraction pattern