Alexander Leon

Person

Santa Clara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Circuit board testing using a probe
- Patent number 8,253,430
- Issue date Aug 28, 2012
- Hewlett-Packard Development Company
- Alexander Leon
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Via design for flux residue mitigation
- Patent number 8,102,057
- Issue date Jan 24, 2012
- Hewlett-Packard Development Company, L.P.
- Alexander Leon
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of treating and probing a via
- Patent number 7,954,693
- Issue date Jun 7, 2011
- Hewlett-Packard Development Company, L.P.
- Alexander Leon
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Arcuate blade probe with means for aligning the barrel and the shaft
- Patent number 7,463,046
- Issue date Dec 9, 2008
- Hewlett-Packard Development Company, L.P.
- Alexander Leon
- G01 - MEASURING TESTING
Information Patent Grant
Method of treating and probing a via
- Patent number 7,461,771
- Issue date Dec 9, 2008
- Hewlett-Packard Development Company, L.P.
- Alexander Leon
- G01 - MEASURING TESTING
Information Patent Grant
Methods of using a blade probe for probing a node of a circuit
- Patent number 7,453,278
- Issue date Nov 18, 2008
- Hewlett-Packard Development Company, L.P.
- Alexander Leon
- G01 - MEASURING TESTING
Information Patent Grant
Dual arcuate blade probe tip
- Patent number 7,279,912
- Issue date Oct 9, 2007
- Hewlett-Packard Development Company, L.P.
- Alexander Leon
- G01 - MEASURING TESTING
Information Patent Grant
Arcuate blade probe
- Patent number 7,248,065
- Issue date Jul 24, 2007
- Hewlett-Packard Development Company, L.P.
- Alexander Leon
- G01 - MEASURING TESTING
Information Patent Grant
Synthesized music, sound and light system
- Patent number 5,461,188
- Issue date Oct 24, 1995
- Marcello S. Drago
- A43 - FOOTWEAR

Patents Applicationslast 30 patents

Information Patent Application
CIRCUIT BOARD TESTING USING A PROBE
- Publication number 20090058445
- Publication date Mar 5, 2009
- Alexander Leon
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF TREATING AND PROBING A VIA
- Publication number 20090051379
- Publication date Feb 26, 2009
- Alexander Leon
- G01 - MEASURING TESTING
Information Patent Application
Via design for flux residue mitigation
- Publication number 20080160252
- Publication date Jul 3, 2008
- Alexander Leon
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
ARCUATE BLADE PROBE
- Publication number 20070262784
- Publication date Nov 15, 2007
- Alexander Leon
- G01 - MEASURING TESTING
Information Patent Application
Methods Of Using A Blade Probe For Probing A Node Of A Circuit
- Publication number 20070257687
- Publication date Nov 8, 2007
- Alexander Leon
- G01 - MEASURING TESTING
Information Patent Application
Pronged fork probe tip
- Publication number 20070084903
- Publication date Apr 19, 2007
- Alexander Leon
- G01 - MEASURING TESTING
Information Patent Application
Dual arcuate blade probe
- Publication number 20070085555
- Publication date Apr 19, 2007
- Alexander Leon
- G01 - MEASURING TESTING
Information Patent Application
Arcuate blade probe
- Publication number 20060238208
- Publication date Oct 26, 2006
- Alexander Leon
- G01 - MEASURING TESTING
Information Patent Application
Method of treating and probing a via
- Publication number 20060237516
- Publication date Oct 26, 2006
- Alexander Leon
- G01 - MEASURING TESTING

Alexander Leon

Person

Patents Grantslast 30 patents

Circuit board testing using a probe

Via design for flux residue mitigation

Method of treating and probing a via

Arcuate blade probe with means for aligning the barrel and the shaft

Method of treating and probing a via

Methods of using a blade probe for probing a node of a circuit

Dual arcuate blade probe tip

Arcuate blade probe

Synthesized music, sound and light system

Patents Applicationslast 30 patents

CIRCUIT BOARD TESTING USING A PROBE

METHOD OF TREATING AND PROBING A VIA

Via design for flux residue mitigation

ARCUATE BLADE PROBE

Methods Of Using A Blade Probe For Probing A Node Of A Circuit

Pronged fork probe tip

Dual arcuate blade probe

Arcuate blade probe

Method of treating and probing a via