Alexander M. Friz

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Area-selective deposition of metal nitride to fabricate devices
- Patent number 11,882,770
- Issue date Jan 23, 2024
- International Business Machines Corporation
- Rudy J. Wojtecki
Information Patent Grant
Hybrid topographical and chemical pre-patterns for directed self-as...
- Patent number 10,059,820
- Issue date Aug 28, 2018
- International Business Machines Corporation
- Markus Brink
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Grant
Hybrid topographical and chemical pre-patterns for directed self-as...
- Patent number 9,738,765
- Issue date Aug 22, 2017
- International Business Machines Corporation
- Markus Brink
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Silicon containing coating compositions and methods of use
- Patent number 8,802,347
- Issue date Aug 12, 2014
- International Business Machines Corporation
- Robert D. Allen
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Resist recovery method
- Patent number 7,531,040
- Issue date May 12, 2009
- ASML Holdings N.V.
- Joseph Consolini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device manufacturing method and a calibration substrate
- Patent number 7,501,215
- Issue date Mar 10, 2009
- ASML Netherlands B.V.
- Keith Frank Best
- A41 - WEARING APPAREL
Information Patent Grant
Method for measuring bonding quality of bonded substrates, metrolog...
- Patent number 7,410,880
- Issue date Aug 12, 2008
- ASML Netherlands B.V.
- Keith Frank Best
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Alternate side lithographic substrate imaging
- Patent number 7,320,847
- Issue date Jan 22, 2008
- ASML Netherlands B.V.
- Keith Frank Best
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and apparatuses for applying wafer-alignment marks
- Patent number 7,256,865
- Issue date Aug 14, 2007
- ASML Holding N.V.
- Joseph Consolini
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of measurement, method for providing alignment marks, and de...
- Patent number 7,130,049
- Issue date Oct 31, 2006
- ASML Netherlands B.V.
- Joseph J. Consolini
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of aligning a substrate, a computer program, a device manufa...
- Patent number 7,041,996
- Issue date May 9, 2006
- ASML Netherlands B.V.
- Keith Frank Best
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic projection mask, device manufacturing method, and devi...
- Patent number 7,019,814
- Issue date Mar 28, 2006
- ASML Netherlands B.V.
- Keith Frank Best
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithographic apparatus, alignment method and device manufacturing m...
- Patent number 6,914,664
- Issue date Jul 5, 2005
- ASML Netherlands B.V.
- Keith Frank Best
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
AREA-SELECTIVE DEPOSITION OF METAL NITRIDE TO FABRICATE DEVICES
- Publication number 20220190229
- Publication date Jun 16, 2022
- International Business Machines Corporation
- Rudy J. Wojtecki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HYBRID TOPOGRAPHICAL AND CHEMICAL PRE-PATTERNS FOR DIRECTED SELF-AS...
- Publication number 20170321025
- Publication date Nov 9, 2017
- International Business Machines Corporation
- Markus Brink
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
HYBRID TOPOGRAPHICAL AND CHEMICAL PRE-PATTERNS FOR DIRECTED SELF-AS...
- Publication number 20160244581
- Publication date Aug 25, 2016
- International Business Machines Corporation
- Markus Brink
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
SILICON CONTAINING COATING COMPOSITIONS AND METHODS OF USE
- Publication number 20110111345
- Publication date May 12, 2011
- International Business Machines Corporation
- Robert D. Allen
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
Methods and apparatuses for applying wafer-alignment marks
- Publication number 20070196746
- Publication date Aug 23, 2007
- Joseph Consolini
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Device manufacturing method and a calibration substrate
- Publication number 20060292463
- Publication date Dec 28, 2006
- ASML NETHERLANDS B.V.
- Keith Frank Best
- A41 - WEARING APPAREL
Information Patent Application
Substrate and lithography process using the same
- Publication number 20060138681
- Publication date Jun 29, 2006
- ASML NETHERLANDS B.V.
- Keith Frank Best
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method for measuring bonding quality of bonded substrates, metrolog...
- Publication number 20060141738
- Publication date Jun 29, 2006
- ASML NETHERLANDS B.V.
- Keith Frank Best
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Method of providing alignment marks, method of aligning a substrate...
- Publication number 20060035159
- Publication date Feb 16, 2006
- ASML NETHERLANDS B.V.
- Keith Frank Best
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of measurement, method for providing alignment marks, and de...
- Publication number 20050146721
- Publication date Jul 7, 2005
- ASML NETHERLANDS B.V.
- Joseph J. Consolini
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods and apparatuses for applying wafer-alignment marks
- Publication number 20050089762
- Publication date Apr 28, 2005
- Joseph Consolini
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Resist recovery method
- Publication number 20050072733
- Publication date Apr 7, 2005
- Joseph Consolini
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Lithographic projection mask, device manufacturing method, and devi...
- Publication number 20040156027
- Publication date Aug 12, 2004
- ASML NETHERLANDS B.V.
- Keith Frank Best
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Alternate side lithographic substrate imaging
- Publication number 20040142256
- Publication date Jul 22, 2004
- ASML NETHERLANDS B.V.
- Keith Frank Best
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of aligning a substrate, computer program, device manufactur...
- Publication number 20040124375
- Publication date Jul 1, 2004
- ASML NETHERLANDS B.V.
- Keith Frank Best
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Lithographic apparatus, alignment method and device manufacturing m...
- Publication number 20030227604
- Publication date Dec 11, 2003
- ASML NETHERLANDS, B.V.
- Keith Frank Best
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Alexander M. Friz

Person

Patents Grantslast 30 patents

Area-selective deposition of metal nitride to fabricate devices

Hybrid topographical and chemical pre-patterns for directed self-as...

Hybrid topographical and chemical pre-patterns for directed self-as...

Silicon containing coating compositions and methods of use

Resist recovery method

Device manufacturing method and a calibration substrate

Method for measuring bonding quality of bonded substrates, metrolog...

Alternate side lithographic substrate imaging

Methods and apparatuses for applying wafer-alignment marks

Method of measurement, method for providing alignment marks, and de...

Method of aligning a substrate, a computer program, a device manufa...

Lithographic projection mask, device manufacturing method, and devi...

Lithographic apparatus, alignment method and device manufacturing m...

Patents Applicationslast 30 patents

AREA-SELECTIVE DEPOSITION OF METAL NITRIDE TO FABRICATE DEVICES

HYBRID TOPOGRAPHICAL AND CHEMICAL PRE-PATTERNS FOR DIRECTED SELF-AS...

HYBRID TOPOGRAPHICAL AND CHEMICAL PRE-PATTERNS FOR DIRECTED SELF-AS...

SILICON CONTAINING COATING COMPOSITIONS AND METHODS OF USE

Methods and apparatuses for applying wafer-alignment marks

Device manufacturing method and a calibration substrate

Substrate and lithography process using the same

Method for measuring bonding quality of bonded substrates, metrolog...

Method of providing alignment marks, method of aligning a substrate...

Method of measurement, method for providing alignment marks, and de...

Methods and apparatuses for applying wafer-alignment marks

Resist recovery method

Lithographic projection mask, device manufacturing method, and devi...

Alternate side lithographic substrate imaging

Method of aligning a substrate, computer program, device manufactur...

Lithographic apparatus, alignment method and device manufacturing m...