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Alexander Mairov
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Herzlyiah, IL
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Patents Grants
last 30 patents
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Patent Grant
Analyzing a buried layer of a sample
Patent number
11,598,633
Issue date
Mar 7, 2023
Applied Materials Israel Ltd.
Alexander Mairov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Adaptive geometry for optimal focused ion beam etching
Patent number
11,315,754
Issue date
Apr 26, 2022
Applied Materials Israel Ltd.
Ilya Blayvas
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Holes tilt angle measurement using FIB diagonal cut
Patent number
11,280,749
Issue date
Mar 22, 2022
Applied Materials Israel Ltd.
Yehuda Zur
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
ANALYZING A BURIED LAYER OF A SAMPLE
Publication number
20230019567
Publication date
Jan 19, 2023
APPLIED MATERIALS ISRAEL LTD.
Alexander Mairov
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE GEOMETRY FOR OPTIMAL FOCUSED ION BEAM ETCHING
Publication number
20210335571
Publication date
Oct 28, 2021
APPLIED MATERIALS ISRAEL LTD.
Ilya Blayvas
H01 - BASIC ELECTRIC ELEMENTS