Alexander Mazurenko

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Dedham, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for reducing probe wavelength in laser excited...
- Patent number 8,184,300
- Issue date May 22, 2012
- Alexander Mazurenko
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring deep trenches with model-based optical spectros...
- Patent number 7,839,509
- Issue date Nov 23, 2010
- Advanced Metrology Systems LLC
- Peter Rosenthal
- G01 - MEASURING TESTING
Information Patent Grant
Opto-acoustic apparatus with optical heterodyning for measuring sol...
- Patent number 7,327,468
- Issue date Feb 5, 2008
- Advanced Metrology Systems LLC
- Alexei Maznev
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR REDUCING PROBE WAVELENGTH IN LASER EXCITED...
- Publication number 20090303496
- Publication date Dec 10, 2009
- Advanced Metrology Systems, LLC
- Alexander Mazurenko
- G01 - MEASURING TESTING
Information Patent Application
Method of Measuring Deep Trenches with Model-Based Optical Spectros...
- Publication number 20090122321
- Publication date May 14, 2009
- Peter Rosenthal
- G01 - MEASURING TESTING
Information Patent Application
Measuring Diffractive Structures By Parameterizing Spectral Features
- Publication number 20080049214
- Publication date Feb 28, 2008
- Alexei Maznev
- G01 - MEASURING TESTING
Information Patent Application
Opto-acoustic apparatus with optical heterodyning for measuring sol...
- Publication number 20040174529
- Publication date Sep 9, 2004
- Alexei Maznev
- G01 - MEASURING TESTING