Alexander N. Pronin

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Twinsburg, OH, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe card system for testing an integrated circuit
- Patent number 11,002,761
- Issue date May 11, 2021
- KEITHLEY INSTRUMENTS, LLC
- Vladimir V. Genkin
- G01 - MEASURING TESTING
Information Patent Grant
Gate charge measurements using two source measure units
- Patent number 10,962,585
- Issue date Mar 30, 2021
- KEITHLEY INSTRUMENTS, LLC
- Alexander N. Pronin
- G01 - MEASURING TESTING
Information Patent Grant
RF and pulse bias tee
- Patent number 7,224,160
- Issue date May 29, 2007
- Keithley Instruments, Inc.
- Alexander N. Pronin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MEMS DEVICE MEASUREMENTS USING PULSE MEASURE UNIT
- Publication number 20240168082
- Publication date May 23, 2024
- KEITHLEY INSTRUMENTS, LLC
- Jin Kwang Yu
- G01 - MEASURING TESTING
Information Patent Application
CORRECTING FOR LOAD RESISTANCE WHEN MAKING I-V MEASUREMENTS WITH CO...
- Publication number 20240036101
- Publication date Feb 1, 2024
- KEITHLEY INSTRUMENTS, LLC
- Alexander N. Pronin
- G01 - MEASURING TESTING
Information Patent Application
Gate Charge Measurements Using Two Source Measure Units
- Publication number 20190346501
- Publication date Nov 14, 2019
- KEITHLEY INSTRUMENTS, LLC
- Alexander N. Pronin
- G01 - MEASURING TESTING
Information Patent Application
Probe Card System Having A Dielectric Fluid Dispenser
- Publication number 20190064216
- Publication date Feb 28, 2019
- KEITHLEY INSTRUMENTS, LLC
- Vladimir V. Genkin
- B05 - SPRAYING OR ATOMISING IN GENERAL APPLYING LIQUIDS OR OTHER FLUENT MATER...
Information Patent Application
Probe Card System for Testing an Integrated Circuit
- Publication number 20190033343
- Publication date Jan 31, 2019
- KEITHLEY INSTRUMENTS, LLC
- Vladimir V. Genkin
- G01 - MEASURING TESTING