Alexander Savtchouk

Follow

Person

Tampa, FL, US

People

Patents Grantslast 30 patents

Information Patent Grant
Steady state method for measuring the thickness and the capacitance...
- Patent number 6,680,621
- Issue date Jan 20, 2004
- Semiconductor Diagnostics, Inc.
- Alexander Savtchouk
- G01 - MEASURING TESTING
Information Patent Grant
Steady state method for measuring the thickness and the capacitance...
- Patent number 6,597,193
- Issue date Jul 22, 2003
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of different mobile ion concentrations in the oxide lay...
- Patent number 6,569,691
- Issue date May 27, 2003
- Semiconductor Diagnostics, Inc.
- Lubomir L. Jastrzebski
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring stress induced leakage current and gate dielec...
- Patent number 6,538,462
- Issue date Mar 25, 2003
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Grant
Device for electrically contacting a floating semiconductor wafer h...
- Patent number 6,114,865
- Issue date Sep 5, 2000
- Semiconductor Diagnostics, Inc.
- Jacek Lagowski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Steady state method for measuring the thickness and the capacitance...
- Publication number 20020130674
- Publication date Sep 19, 2002
- Jacek Lagowski
- G01 - MEASURING TESTING
Information Patent Application
Steady state method for measuring the thickness and the capacitance...
- Publication number 20020125900
- Publication date Sep 12, 2002
- Alexander Savtchouk
- G01 - MEASURING TESTING