Alexander Shulman

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Rehovot, IL

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Patents Grantslast 30 patents

Information Patent Grant
Method for determining the internal orientation of a wafer
- Patent number 6,544,805
- Issue date Apr 8, 2003
- Nova Measuring Instruments Ltd.
- Ido Holcman
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Method for determining the internal orientation of a wafer
- Publication number 20020042153
- Publication date Apr 11, 2002
- Ido Holcman
- H01 - BASIC ELECTRIC ELEMENTS