Alexander Sirch

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Freising, DE

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Patents Grantslast 30 patents

Information Patent Grant
IC fabrication flow with dynamic sampling for measurement
- Patent number 12,169,178
- Issue date Dec 17, 2024
- Texas Instruments Incorporated
- Jonas Hoehenberger
- G01 - MEASURING TESTING
Information Patent Grant
Method of monitoring the light integrator of a photolithography system
- Patent number 7,423,729
- Issue date Sep 9, 2008
- Texas Instruments Incorporated
- Alexander Urban
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
IC FABRICATION FLOW WITH DYNAMIC SAMPLING FOR MEASUREMENT
- Publication number 20230366832
- Publication date Nov 16, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Jonas Hoehenberger
- G01 - MEASURING TESTING
Information Patent Application
Method of monitoring the light integrator of a photolithography system
- Publication number 20060055908
- Publication date Mar 16, 2006
- Alexander Urban
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY