Alexander Slobodov

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for simultaneous tilt and height control of a sub...
- Patent number 9,810,619
- Issue date Nov 7, 2017
- KLA-Tencor Corporation
- Zhongping Cai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning inspection system with angular correction
- Patent number 9,587,936
- Issue date Mar 7, 2017
- KLA-Tencor Corporation
- Yury Yuditsky
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Extended defect sizing range for wafer inspection
- Patent number 9,091,666
- Issue date Jul 28, 2015
- KLA-Tencor Corp.
- Zhongping Cai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method for high-speed serial data transfer
- Patent number 8,139,840
- Issue date Mar 20, 2012
- KLA-Tencor Corporation
- Yunxian Chu
- G01 - MEASURING TESTING
Information Patent Grant
Systems, circuits and methods for extending the detection range of...
- Patent number 7,777,875
- Issue date Aug 17, 2010
- KLA-Tencor Technologies Corp,
- Christian H. Wolters
- G01 - MEASURING TESTING
Information Patent Grant
Inspection systems and methods for extending the detection range of...
- Patent number 7,746,462
- Issue date Jun 29, 2010
- KLA-Tencor Technologies Corporation
- Zhongping Cai
- G01 - MEASURING TESTING
Information Patent Grant
Systems, circuits and methods for extending the detection range of...
- Patent number 7,423,250
- Issue date Sep 9, 2008
- KLA-Tencor Technologies Corp.
- Christian H. Wolters
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems, circuits and methods for extending the detection range of...
- Patent number 7,414,715
- Issue date Aug 19, 2008
- KLA-Tencor Technologies Corp.
- Christian H. Wolters
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Scanning Inspection System With Angular Correction
- Publication number 20140278188
- Publication date Sep 18, 2014
- Yury Yuditsky
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Tilt and Height Control of a Substrate Surfac...
- Publication number 20140071457
- Publication date Mar 13, 2014
- KLA-Tencor Corporation
- Zhongping Cai
- G01 - MEASURING TESTING
Information Patent Application
Extended Defect Sizing Range for Wafer Inspection
- Publication number 20130208269
- Publication date Aug 15, 2013
- KLA-Tencor Corporation
- Zhongping Cai
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS, CIRCUITS AND METHODS FOR EXTENDING THE DETECTION RANGE OF...
- Publication number 20090040511
- Publication date Feb 12, 2009
- KLA-Tencor Technologies Corporation
- Christian H. Wolters
- G01 - MEASURING TESTING
Information Patent Application
Inspection Systems and Methods for Extending the Detection Range of...
- Publication number 20080291454
- Publication date Nov 27, 2008
- KLA-TENCOR TECHNOLOGIES CORP.
- Zhongping Cai
- G01 - MEASURING TESTING
Information Patent Application
Systems, circuits and methods for extending the detection range of...
- Publication number 20070013899
- Publication date Jan 18, 2007
- Christian H. Wolters
- G01 - MEASURING TESTING
Information Patent Application
Systems, circuits and methods for extending the detection range of...
- Publication number 20070012867
- Publication date Jan 18, 2007
- Christian H. Wolters
- H03 - BASIC ELECTRONIC CIRCUITRY

Alexander Slobodov

Person

Patents Grantslast 30 patents

Method and system for simultaneous tilt and height control of a sub...

Scanning inspection system with angular correction

Extended defect sizing range for wafer inspection

Inspection system and method for high-speed serial data transfer

Systems, circuits and methods for extending the detection range of...

Inspection systems and methods for extending the detection range of...

Systems, circuits and methods for extending the detection range of...

Systems, circuits and methods for extending the detection range of...

Patents Applicationslast 30 patents

Scanning Inspection System With Angular Correction

Method and System for Tilt and Height Control of a Substrate Surfac...

Extended Defect Sizing Range for Wafer Inspection

SYSTEMS, CIRCUITS AND METHODS FOR EXTENDING THE DETECTION RANGE OF...

Inspection Systems and Methods for Extending the Detection Range of...

Systems, circuits and methods for extending the detection range of...

Systems, circuits and methods for extending the detection range of...