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Alexander Stein
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Springfield, NJ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Dual waveband temperature detector
Patent number
10,215,643
Issue date
Feb 26, 2019
Exergen Corporation
Alexander Stein
G01 - MEASURING TESTING
Information
Patent Grant
Dual waveband temperature detector
Patent number
9,335,219
Issue date
May 10, 2016
Exergen Corporation
Alexander Stein
G01 - MEASURING TESTING
Information
Patent Grant
Pyrometer
Patent number
9,028,135
Issue date
May 12, 2015
United States of America as represented by the Administrator of the National...
Asia N. Quince
G01 - MEASURING TESTING
Information
Patent Grant
Range pyrometer
Patent number
6,375,350
Issue date
Apr 23, 2002
Quantum Logic Corp
Alexander Stein
F24 - HEATING RANGES VENTILATING
Information
Patent Grant
Method for remotely measuring temperatures which utilizes a two wav...
Patent number
5,704,712
Issue date
Jan 6, 1998
Quantum Logic Corporation
Alexander Stein
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring the emissivity of a semiconductor wafer
Patent number
5,597,237
Issue date
Jan 28, 1997
Quantum Logic Corp
Alexander Stein
G01 - MEASURING TESTING
Information
Patent Grant
Pyrometer apparatus for use in rapid thermal processing of semicond...
Patent number
5,308,161
Issue date
May 3, 1994
Quantum Logic Corporation
Alexander Stein
G01 - MEASURING TESTING
Information
Patent Grant
Reflectance probe
Patent number
5,282,017
Issue date
Jan 25, 1994
Quantum Logic Corporation
Ira Kasindorf
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for remote measurement of temperatures
Patent number
4,708,493
Issue date
Nov 24, 1987
Quantum Logic Corporation
Alexander Stein
G01 - MEASURING TESTING
Information
Patent Grant
Pyrometer 1
Patent number
4,647,775
Issue date
Mar 3, 1987
Quantum Logic Corporation
Alexander Stein
G01 - MEASURING TESTING
Information
Patent Grant
Pyrometer #2
Patent number
4,647,774
Issue date
Mar 3, 1987
Quantum Logic Corporation
Richard Brisk
G01 - MEASURING TESTING
Information
Patent Grant
Pyrometer measurements in the presence of intense ambient radiation
Patent number
4,611,930
Issue date
Sep 16, 1986
Exxon Research and Engineering Co.
Alexander Stein
G01 - MEASURING TESTING
Information
Patent Grant
System for monitoring trace gaseous ammonia concentration in flue g...
Patent number
4,471,220
Issue date
Sep 11, 1984
Exxon Research and Engineering Co.
Bruce N. Perry
G01 - MEASURING TESTING
Information
Patent Grant
Pyrometric gas temperature measurement system
Patent number
4,440,510
Issue date
Apr 3, 1984
Exxon Research and Engineering Co.
Alexander Stein
G01 - MEASURING TESTING
Information
Patent Grant
Laser radiometer
Patent number
4,417,822
Issue date
Nov 29, 1983
Exxon Research and Engineering Company
Alexander Stein
G01 - MEASURING TESTING
Information
Patent Grant
Device for producing high-powered radiation employing stimulated Ra...
Patent number
4,245,171
Issue date
Jan 13, 1981
Exxon Research and Engineering Co.
Paul Rabinowitz
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
DUAL WAVEBAND TEMPERATURE DETECTOR
Publication number
20160356653
Publication date
Dec 8, 2016
Exergen Corporation
Alexander Stein
G01 - MEASURING TESTING
Information
Patent Application
DUAL WAVEBAND TEMPERATURE DETECTOR
Publication number
20120183013
Publication date
Jul 19, 2012
Exergen Corporation
Alexander Stein
G01 - MEASURING TESTING