Alexander Stein

Person

  • Springfield, NJ, US

Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    DUAL WAVEBAND TEMPERATURE DETECTOR

    • Publication number 20160356653
    • Publication date Dec 8, 2016
    • Exergen Corporation
    • Alexander Stein
    • G01 - MEASURING TESTING
  • Information Patent Application

    DUAL WAVEBAND TEMPERATURE DETECTOR

    • Publication number 20120183013
    • Publication date Jul 19, 2012
    • Exergen Corporation
    • Alexander Stein
    • G01 - MEASURING TESTING