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Alexander T. Sutherland
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Edinburgh, GB
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Patents Grants
last 30 patents
Information
Patent Grant
Differential calibration
Patent number
7,900,367
Issue date
Mar 8, 2011
Renishaw plc
Alexander Tennant Sutherland
G01 - MEASURING TESTING
Information
Patent Grant
Calibration method and apparatus
Patent number
7,866,056
Issue date
Jan 11, 2011
Renishaw plc
John Charles Ould
G01 - MEASURING TESTING
Information
Patent Grant
Calibration of an analogue probe
Patent number
6,909,983
Issue date
Jun 21, 2005
Renishaw PLC
Alexander Tennant Sutherland
G01 - MEASURING TESTING
Information
Patent Grant
Use of surface measuring probes
Patent number
6,810,597
Issue date
Nov 2, 2004
Renishaw PLC
Jean-Louis Grzesiak
G01 - MEASURING TESTING
Information
Patent Grant
Method of calibrating a scanning system
Patent number
6,601,311
Issue date
Aug 5, 2003
Renishaw PLC
David R McMurtry
G01 - MEASURING TESTING
Information
Patent Grant
Calibrations of an analogue probe and error mapping
Patent number
6,580,964
Issue date
Jun 17, 2003
Renishaw PLC
Alexander T Sutherland
G01 - MEASURING TESTING
Information
Patent Grant
Method of calibrating a scanning system
Patent number
6,434,846
Issue date
Aug 20, 2002
Erenishaw PLC
David R McMurtry
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Method of and apparatus for measuring workpieces using a coordinate...
Patent number
6,131,301
Issue date
Oct 17, 2000
Renishaw plc
Alexander T Sutherland
G01 - MEASURING TESTING
Information
Patent Grant
Method for scanning the surface of an object
Patent number
5,499,194
Issue date
Mar 12, 1996
Renishaw plc
Tim Prestidge
G05 - CONTROLLING REGULATING
Information
Patent Grant
Method of controlling a coordinate positioning machine for measurem...
Patent number
5,334,918
Issue date
Aug 2, 1994
Renishaw plc
David R. McMurtry
G05 - CONTROLLING REGULATING
Information
Patent Grant
Error determination for multi-axis apparatus due to thermal distortion
Patent number
5,001,842
Issue date
Mar 26, 1991
Ferranti International plc
David A. Wright
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CALIBRATION METHOD AND APPARATUS
Publication number
20100018069
Publication date
Jan 28, 2010
RENISHAW PLC
John Charles Ould
G01 - MEASURING TESTING
Information
Patent Application
Differential Calibration
Publication number
20090307915
Publication date
Dec 17, 2009
RENISHAW PLC
Alexander Tennant Sutherland
G01 - MEASURING TESTING
Information
Patent Application
Use of surface measuring probes
Publication number
20040055170
Publication date
Mar 25, 2004
RENISHAW PLC
Jean-Louis Grzesiak
G01 - MEASURING TESTING
Information
Patent Application
Calibrations of an analogue probe and error mapping
Publication number
20030009257
Publication date
Jan 9, 2003
RENISHAW PLC
Alexander T. Sutherland
G01 - MEASURING TESTING
Information
Patent Application
Method of calibrating a scanning system
Publication number
20020174555
Publication date
Nov 28, 2002
Renishaw PLC
David R. McMurtry
B82 - NANO-TECHNOLOGY