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Alexander Viacheslavovich SHCHERBAKOV
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Moscow region, RU
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Patents Grants
last 30 patents
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Patent Grant
Laser speckle interferometric system and method for mobile devices
Patent number
10,206,576
Issue date
Feb 19, 2019
Samsung Electronics Co., Ltd.
Alexander Viacheslavovich Shcherbakov
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and device for measuring critical dimension of nanostructure
Patent number
9,400,254
Issue date
Jul 26, 2016
Samsung Electronics Co., Ltd.
Alexander Viacheslavovich Shcherbakov
G01 - MEASURING TESTING
Information
Patent Grant
Optical measuring system and method of measuring critical size
Patent number
9,322,640
Issue date
Apr 26, 2016
SAMSING ELECTRONICS CO., LTD.
Sergey Nikolaevich Koptyaev
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
LASER SPECKLE INTERFEROMETRIC SYSTEM AND METHOD FOR MOBILE DEVICES
Publication number
20160066790
Publication date
Mar 10, 2016
Samsung Electronics Co., Ltd.
Alexander Viacheslavovich SHCHERBAKOV
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND DEVICE FOR MEASURING CRITICAL DIMENSION OF NANOSTRUCTURE
Publication number
20150276378
Publication date
Oct 1, 2015
Samsung Electronics Co., Ltd.
Alexander Viacheslavovich SHCHERBAKOV
B82 - NANO-TECHNOLOGY