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Alexander Weiss
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Linden, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method for correcting a spherical aberration of a microscope, and m...
Patent number
12,099,185
Issue date
Sep 24, 2024
Leica Microsystems CMS GmbH
Christian Schumann
G02 - OPTICS
Information
Patent Grant
Microscope and method for generating an overview image of a sample
Patent number
12,038,570
Issue date
Jul 16, 2024
Leica Microsystems CMS GmbH
Christian Schumann
G02 - OPTICS
Information
Patent Grant
Method and microscope for determining the thickness of a cover slip...
Patent number
11,971,531
Issue date
Apr 30, 2024
Leica Microsystems CMS GmbH
Alexander Weiss
G01 - MEASURING TESTING
Information
Patent Grant
Method and microscope for determining the refractive index of an op...
Patent number
11,635,608
Issue date
Apr 25, 2023
Leica Microsystems CMS GmbH
Alexander Weiss
G01 - MEASURING TESTING
Information
Patent Grant
Light sheet microscope and method for determining the refractive in...
Patent number
11,500,189
Issue date
Nov 15, 2022
Leica Microsystems CMS GmbH
Alexander Weiss
G02 - OPTICS
Information
Patent Grant
Microscope and method for determining an aberration in a microscope
Patent number
11,415,789
Issue date
Aug 16, 2022
Leica Microsystems CMS GmbH
Christian Schumann
G02 - OPTICS
Information
Patent Grant
Device and method for feeding an immersion medium
Patent number
11,216,017
Issue date
Jan 4, 2022
Leica Microsystems CMS GmbH
Alexander Weiss
G01 - MEASURING TESTING
Information
Patent Grant
Method for imaging in a microscope with oblique illumination
Patent number
10,823,951
Issue date
Nov 3, 2020
Leica Microsystems CMS GmbH
Benjamin Deissler
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
CONFOCAL MICROSCOPE AND A METHOD OF ADJUSTING A CONFOCAL MICROSCOPE
Publication number
20240255743
Publication date
Aug 1, 2024
Leica Microsystems CMS GmbH
Cornell Peter GONSCHIOR
G02 - OPTICS
Information
Patent Application
LIGHT SHEET MICROSCOPE AND METHOD FOR DETERMINING THE REFRACTIVE IN...
Publication number
20220206281
Publication date
Jun 30, 2022
Leica Microsystems CMS GmbH
Alexander Weiss
G01 - MEASURING TESTING
Information
Patent Application
MICROSCOPE AND METHOD FOR GENERATING AN OVERVIEW IMAGE OF A SAMPLE
Publication number
20220011561
Publication date
Jan 13, 2022
Leica Microsystems CMS GmbH
Christian SCHUMANN
G02 - OPTICS
Information
Patent Application
METHOD AND MICROSCOPE FOR DETERMINING THE THICKNESS OF A COVER SLIP...
Publication number
20210349298
Publication date
Nov 11, 2021
Leica Microsystems CMS GmbH
Alexander Weiss
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND MICROSCOPE FOR DETERMINING THE REFRACTIVE INDEX OF AN OP...
Publication number
20210341721
Publication date
Nov 4, 2021
Leica Microsystems CMS GmbH
Alexander Weiss
G02 - OPTICS
Information
Patent Application
METHOD FOR CORRECTING A SPHERICAL ABERRATION OF A MICROSCOPE, AND M...
Publication number
20210341735
Publication date
Nov 4, 2021
Leica Microsystems CMS GmbH
Christian Schumann
G02 - OPTICS
Information
Patent Application
MICROSCOPE AND METHOD FOR DETERMINING AN ABERRATION IN A MICROSCOPE
Publication number
20210124160
Publication date
Apr 29, 2021
Leica Microsystems CMS GmbH
Christian SCHUMANN
G02 - OPTICS
Information
Patent Application
DEVICE AND METHOD FOR FEEDING AN IMMERSION MEDIUM
Publication number
20200319659
Publication date
Oct 8, 2020
Leica Microsystems CMS GmbH
Alexander WEISS
G02 - OPTICS
Information
Patent Application
METHOD FOR IMAGING IN A MICROSCOPE WITH OBLIQUE ILLUMINATION
Publication number
20190391380
Publication date
Dec 26, 2019
Leica Microsystems CMS GmbH
Benjamin Deissler
G06 - COMPUTING CALCULATING COUNTING