Alexandre CROGUENNEC

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MEYREUIL, FR

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Patents Grantslast 30 patents

Information Patent Grant
Tester for integrated circuits on a silicon wafer and integrated ci...
- Patent number 10,088,526
- Issue date Oct 2, 2018
- STARCHIP
- Cyrille Lambert
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TESTER FOR INTEGRATED CIRCUITS ON A SILICON WAFER AND INTEGRATED CI...
- Publication number 20160259002
- Publication date Sep 8, 2016
- STARCHIP
- Cyrille LAMBERT
- G01 - MEASURING TESTING