Alexandre Obotnine

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Toronto, CA

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Patents Grantslast 30 patents

Information Patent Grant
Optical sensor device
- Patent number 8,736,846
- Issue date May 27, 2014
- Werth Messtechnik GmbH
- Eric Gurny
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for the auto-focussing infinity corrected micr...
- Patent number 7,700,903
- Issue date Apr 20, 2010
- WDI Wise Device Inc.
- Adam Weiss
- G02 - OPTICS
Information Patent Grant
Method and apparatus for high-throughput inspection of large flat p...
- Patent number 7,180,084
- Issue date Feb 20, 2007
- Photon Dynamics, Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for high-throughput inspection of large flat p...
- Patent number 7,041,998
- Issue date May 9, 2006
- Photon Dynamics, Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Dark view inspection system for transparent media
- Patent number 6,633,377
- Issue date Oct 14, 2003
- Image Processing Systems Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Stereo vision inspection system for transparent media
- Patent number 6,512,239
- Issue date Jan 28, 2003
- Photon Dynamics Canada Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Grant
Glass inspection system including bright field and dark field illum...
- Patent number 6,437,357
- Issue date Aug 20, 2002
- Photon Dynamics Canada Inc.
- Adam Weiss
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SENSOR DEVICE
- Publication number 20110037987
- Publication date Feb 17, 2011
- Eric Gurny
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR THE AUTO-FOCUSSING INFINITY CORRECTED MICR...
- Publication number 20080002252
- Publication date Jan 3, 2008
- Wegu-Device Inc.
- Adam WEISS
- G02 - OPTICS
Information Patent Application
Method and apparatus for high-throughput inspection of large flat p...
- Publication number 20060186361
- Publication date Aug 24, 2006
- Photon Dynamics, Inc.
- Adam Weiss
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for high-throughput inspection of large flat p...
- Publication number 20040188643
- Publication date Sep 30, 2004
- Photon Dynamics, Inc.
- Adam Weiss
- G01 - MEASURING TESTING