Alexandru ONOSE

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Metrology method and apparatus, computer program and lithographic s...
- Patent number 11,994,806
- Issue date May 28, 2024
- ASML Netherlands B.V.
- Alexandru Onose
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of calibrating a plurality of metrology apparatuses, method...
- Patent number 11,556,060
- Issue date Jan 17, 2023
- ASML Netherlands B.V.
- Seyed Iman Mossavat
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining a value of a parameter of interest of a targe...
- Patent number 10,585,048
- Issue date Mar 10, 2020
- ASML Netherlands B.V.
- Samee Ur Rehman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Estimation of data in metrology
- Patent number 10,429,746
- Issue date Oct 1, 2019
- ASML Netherlands B.V.
- Alexandru Onose
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIM...
- Publication number 20240354552
- Publication date Oct 24, 2024
- ASML NETHERLANDS B.V.
- Alexandru ONOSE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIM...
- Publication number 20240060906
- Publication date Feb 22, 2024
- ASML NETHERLANDS B.V.
- Bart Jacobus Martinus TIEMERSMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIM...
- Publication number 20240061347
- Publication date Feb 22, 2024
- ASML NETHERLANDS B.V.
- Alexandru ONOSE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY METHOD AND APPARATUS, COMPUTER PROGRAM AND LITHOGRAPHIC S...
- Publication number 20220171290
- Publication date Jun 2, 2022
- ASML NETHERLANDS B.V.
- Alexandru ONOSE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method of Calibrating a Plurality of Metrology Apparatuses, Method...
- Publication number 20200110341
- Publication date Apr 9, 2020
- ASML NETHERLANDS B.V.
- Seyed Iman MOSSAVAT
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD OF DETERMINING A VALUE OF A PARAMETER OF INTEREST OF A TARGE...
- Publication number 20190323972
- Publication date Oct 24, 2019
- ASML NETHERLANDS B.V.
- Samee Ur REHMAN
- G01 - MEASURING TESTING
Information Patent Application
ESTIMATION OF DATA IN METROLOGY
- Publication number 20190129313
- Publication date May 2, 2019
- ASML NETHERLANDS B.V.
- Alexandru ONOSE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Alexandru ONOSE

Person

Patents Grantslast 30 patents

Metrology method and apparatus, computer program and lithographic s...

Method of calibrating a plurality of metrology apparatuses, method...

Method of determining a value of a parameter of interest of a targe...

Estimation of data in metrology

Patents Applicationslast 30 patents

MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIM...

MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIM...

MODULAR AUTOENCODER MODEL FOR MANUFACTURING PROCESS PARAMETER ESTIM...

METROLOGY METHOD AND APPARATUS, COMPUTER PROGRAM AND LITHOGRAPHIC S...

Method of Calibrating a Plurality of Metrology Apparatuses, Method...

METHOD OF DETERMINING A VALUE OF A PARAMETER OF INTEREST OF A TARGE...

ESTIMATION OF DATA IN METROLOGY