Alexei Maznev

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Natick, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of measuring deep trenches with model-based optical spectros...
- Patent number 7,839,509
- Issue date Nov 23, 2010
- Advanced Metrology Systems LLC
- Peter Rosenthal
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring sub-micron trench structures
- Patent number 7,499,183
- Issue date Mar 3, 2009
- Advanced Metrology Systems, LLC
- Alexei Maznev
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining properties of patterned thin film metal struc...
- Patent number 7,365,864
- Issue date Apr 29, 2008
- Advanced Metrology Systems LLC
- Michael Gostein
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of Measuring Deep Trenches with Model-Based Optical Spectros...
- Publication number 20090122321
- Publication date May 14, 2009
- Peter Rosenthal
- G01 - MEASURING TESTING
Information Patent Application
Method of Measuring Sub-Micron Trench Structures
- Publication number 20080123080
- Publication date May 29, 2008
- ADVANCED METROLOGY SYSTEMS LLC
- Alexei Maznev
- G01 - MEASURING TESTING
Information Patent Application
Measuring Diffractive Structures By Parameterizing Spectral Features
- Publication number 20080049214
- Publication date Feb 28, 2008
- Alexei Maznev
- G01 - MEASURING TESTING
Information Patent Application
Method for measuring thin films
- Publication number 20070109540
- Publication date May 17, 2007
- Koninklijke Philips Electronics N.V.
- Alexei Maznev
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring thickness of thin films via tran...
- Publication number 20070024871
- Publication date Feb 1, 2007
- Alexei Maznev
- G01 - MEASURING TESTING
Information Patent Application
Method of determining properties of patterned thin film meatal stru...
- Publication number 20060203876
- Publication date Sep 14, 2006
- Michael Gostein
- G01 - MEASURING TESTING