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Alexei V. Ermakov
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Piscataway, NJ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Systems and methods for real time measurement of surface curvature...
Patent number
11,248,904
Issue date
Feb 15, 2022
Rutgers, The State University of New Jersey
Alexei Ermakov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for real time measurement of surface curvature...
Patent number
11,221,210
Issue date
Jan 11, 2022
Rutgers, The State University of New Jersey
Alexei Ermakov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Electrostatic ion trap mass spectrometer utilizing autoresonant ion...
Patent number
10,037,880
Issue date
Jul 31, 2018
Rutgers, The State University of New Jersey
Alexei Ermakov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrostatic ion trap
Patent number
9,000,364
Issue date
Apr 7, 2015
MKS Instruments, Inc.
Alexei Victorovich Ermakov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electrostatic ion trap
Patent number
8,586,918
Issue date
Nov 19, 2013
Brooks Automation, Inc.
Gerardo A. Brucker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron beam apparatus for work function measurements
Patent number
7,495,216
Issue date
Feb 24, 2009
Alexei Victorovich Ermakov
G01 - MEASURING TESTING
Information
Patent Grant
Three coil apparatus for inductive measurements of conductance
Patent number
6,448,795
Issue date
Sep 10, 2002
Alexei Ermakov
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SYSTEMS AND METHODS FOR REAL TIME MEASUREMENT OF SURFACE CURVATURE...
Publication number
20210164777
Publication date
Jun 3, 2021
Rutgers, The State University of New Jersey
Alexei Ermakov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AN ELECTROSTATIC ION TRAP MASS SPECTROMETER UTILIZING AUTORESONANT...
Publication number
20170018418
Publication date
Jan 19, 2017
Rutgers, The State University of New Jersey
Alexei Ermakov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electrostatic Ion Trap
Publication number
20100084549
Publication date
Apr 8, 2010
Alexei Victorovich Ermakov
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron beam apparatus for work function measurements
Publication number
20080035845
Publication date
Feb 14, 2008
Alexei V. Ermakov
G01 - MEASURING TESTING