Alexei VERSHININ

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Schenectady, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
X-ray diffraction apparatus and technique for measuring grain orien...
- Patent number 8,130,908
- Issue date Mar 6, 2012
- X-Ray Optical Systems, Inc.
- Huapeng Huang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY DIFFRACTION APPARATUS AND TECHNIQUE FOR MEASURING GRAIN ORIEN...
- Publication number 20110038457
- Publication date Feb 17, 2011
- X-Ray Optical Systems, Inc.
- Huapeng HUANG
- G01 - MEASURING TESTING