Alfred O. Feitisch

Person

Cupertino, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reconstruction of frequency registration for quantitative spectroscopy
- Patent number 11,953,427
- Issue date Apr 9, 2024
- Endress+Hauser Optical Analysis, Inc.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer with wide-scan tunable diode laser
- Patent number 11,079,324
- Issue date Aug 3, 2021
- SpectraSensors, Inc.
- Xiang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Radiation shield for near-infrared detectors
- Patent number 10,753,805
- Issue date Aug 25, 2020
- Kaiser Optical Systems Inc.
- Joseph B. Slater
- G01 - MEASURING TESTING
Information Patent Grant
Optical absorbance measurements with self-calibration and extended...
- Patent number 10,746,655
- Issue date Aug 18, 2020
- SpectraSensors, Inc.
- Xiang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Target analyte detection and quantification in sample gases with co...
- Patent number 10,643,008
- Issue date May 5, 2020
- SpectraSensors, Inc.
- Xiang Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Spectrometer with active beam steering
- Patent number 10,620,045
- Issue date Apr 14, 2020
- SpectraSensors, Inc.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Grant
Optical reflectors for spectrometer gas cells
- Patent number 10,488,258
- Issue date Nov 26, 2019
- SpectraSensors, Inc.
- Lutz Keller
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer with active beam steering
- Patent number 10,309,828
- Issue date Jun 4, 2019
- SpectraSensors, Inc.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor laser mounting with intact diffusion barrier layer
- Patent number 10,224,693
- Issue date Mar 5, 2019
- SpectraSensors, Inc.
- Alfred Feitisch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determination and correction of frequency registration deviations f...
- Patent number 10,180,353
- Issue date Jan 15, 2019
- SpectraSensors, Inc.
- Xiang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Reduced volume spectroscopic sample cell
- Patent number 10,156,513
- Issue date Dec 18, 2018
- SpectraSensors, Inc.
- Peter Scott
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer optical head assembly
- Patent number 10,073,028
- Issue date Sep 11, 2018
- SpectraSensors, Inc.
- Joshua Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer with variable beam power and shape
- Patent number 10,072,980
- Issue date Sep 11, 2018
- SpectraSensors, Inc.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer with random beam profiles
- Patent number 10,024,788
- Issue date Jul 17, 2018
- SpectraSensors, Inc.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Grant
Optical absorbance measurements with self-calibration and extended...
- Patent number 9,846,117
- Issue date Dec 19, 2017
- SpectraSensors, Inc.
- Xin Zhou
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer with active beam steering
- Patent number 9,816,860
- Issue date Nov 14, 2017
- SpectraSensors, Inc.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor laser mounting with intact diffusion barrier layer
- Patent number 9,711,937
- Issue date Jul 18, 2017
- SpectraSensors, Inc.
- Alfred Feitisch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determination and correction of frequency registration deviations f...
- Patent number 9,696,204
- Issue date Jul 4, 2017
- SpectraSensors, Inc.
- Xiang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Solderless mounting for semiconductor lasers
- Patent number 9,646,949
- Issue date May 9, 2017
- SpectraSensors, Inc.
- Alfred Feitisch
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Collisional broadening compensation using real or near-real time va...
- Patent number 9,618,391
- Issue date Apr 11, 2017
- SpectraSensors, Inc.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometer with variable beam power and shape
- Patent number 9,518,866
- Issue date Dec 13, 2016
- SpectraSensors, Inc.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor laser mounting for improved frequency stability
- Patent number 9,368,934
- Issue date Jun 14, 2016
- SpectraSensors, Inc.
- Gabi Neubauer
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic reconstruction of a calibration state of an absorption spec...
- Patent number 9,360,415
- Issue date Jun 7, 2016
- SpectraSensors, Inc.
- Xiang Liu
- G01 - MEASURING TESTING
Information Patent Grant
Solderless mounting for semiconductor lasers
- Patent number 9,166,130
- Issue date Oct 20, 2015
- SpectraSensors, Inc.
- Alfred Feitisch
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor laser mounting with intact diffusion barrier layer
- Patent number 9,166,364
- Issue date Oct 20, 2015
- SpectraSensors, Inc.
- Alfred Feitisch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reduced volume spectroscopic sample cell
- Patent number 9,109,951
- Issue date Aug 18, 2015
- SpectraSensors, Inc.
- Peter Scott
- G01 - MEASURING TESTING
Information Patent Grant
Collisional broadening compensation using real or near-real time va...
- Patent number 8,976,358
- Issue date Mar 10, 2015
- SpectraSensors, Inc.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Grant
Validation and correction of spectrometer performance using a valid...
- Patent number 8,953,165
- Issue date Feb 10, 2015
- SpectraSensors, Inc.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Grant
Optical reflectors for spectrometer gas cells
- Patent number 8,842,282
- Issue date Sep 23, 2014
- SpectraSensors, Inc.
- Lutz Keller
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic reconstruction of a calibration state of an absorption spec...
- Patent number 8,711,357
- Issue date Apr 29, 2014
- SpectraSensors, Inc.
- Xiang Liu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECTROMETER WITH WIDE-SCAN TUNABLE DIODE LASER
- Publication number 20210018433
- Publication date Jan 21, 2021
- SPECTRASENSORS, INC.
- Xiang Liu
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR LASER MOUNTING WITH INTACT DIFFUSION BARRIER LAYER
- Publication number 20200185880
- Publication date Jun 11, 2020
- SPECTRASENSORS, INC.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER WITH ACTIVE BEAM STEERING
- Publication number 20190277691
- Publication date Sep 12, 2019
- SPECTRASENSORS, INC.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL REFLECTORS FOR SPECTROMETER GAS CELLS
- Publication number 20190162597
- Publication date May 30, 2019
- SPECTRASENSORS, INC.
- Lutz Keller
- G01 - MEASURING TESTING
Information Patent Application
RADIATION SHIELD FOR NEAR-INFRARED DETECTORS
- Publication number 20180292266
- Publication date Oct 11, 2018
- KAISER OPTICAL SYSTEMS INC.
- Joseph B. Slater
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ABSORBANCE MEASUREMENTS WITH SELF-CALIBRATION AND EXTENDED...
- Publication number 20180156726
- Publication date Jun 7, 2018
- SPECTRASENSORS, INC.
- Xiang Liu
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETER WITH ACTIVE BEAM STEERING
- Publication number 20180128678
- Publication date May 10, 2018
- SPECTRASENSORS, INC.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION AND CORRECTION OF FREQUENCY REGISTRATION DEVIATIONS F...
- Publication number 20180120159
- Publication date May 3, 2018
- SPECTRASENSORS, INC.
- Xiang Liu
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR LASER MOUNTING WITH INTACT DIFFUSION BARRIER LAYER
- Publication number 20170317468
- Publication date Nov 2, 2017
- SPECTRASENSORS, INC.
- Alfred Feitisch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECTROMETER WITH VARIABLE BEAM POWER AND SHAPE
- Publication number 20170248466
- Publication date Aug 31, 2017
- SPECTRASENSORS, INC.
- ALFRED FEITISCH
- G01 - MEASURING TESTING
Information Patent Application
RECONSTRUCTION OF FREQUENCY REGISTRATION FOR QUANTITATIVE SPECTROSCOPY
- Publication number 20170059477
- Publication date Mar 2, 2017
- SPECTRASENSORS, INC.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer Optical Head Assembly
- Publication number 20170059474
- Publication date Mar 2, 2017
- SPECTRASENSORS, INC.
- Joshua Cohen
- G02 - OPTICS
Information Patent Application
Determination and Correction of Frequency Registration Deviations f...
- Publication number 20170038257
- Publication date Feb 9, 2017
- SPECTRASENSORS, INC.
- Xiang Liu
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer with Random Beam Profiles
- Publication number 20160327479
- Publication date Nov 10, 2016
- SPECTRASENSORS, INC.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Application
REDUCED VOLUME SPECTROSCOPIC SAMPLE CELL
- Publication number 20160153890
- Publication date Jun 2, 2016
- SPECTRASENSORS, INC.
- Peter Scott
- G01 - MEASURING TESTING
Information Patent Application
Target Analyte Detection and Quantification in Sample Gases With Co...
- Publication number 20160132617
- Publication date May 12, 2016
- SPECTRASENSORS, INC.
- Xiang Liu
- G01 - MEASURING TESTING
Information Patent Application
Solderless Mounting for Semiconductor Lasers
- Publication number 20160111393
- Publication date Apr 21, 2016
- SPECTRASENSORS, INC.
- Alfred Feitisch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL REFLECTORS FOR SPECTROMETER GAS CELLS
- Publication number 20160084710
- Publication date Mar 24, 2016
- SPECTRASENSORS, INC.
- Lutz Keller
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer With Active Beam Steering
- Publication number 20160054177
- Publication date Feb 25, 2016
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Application
Spectrometer With Variable Beam Power and Shape
- Publication number 20160054178
- Publication date Feb 25, 2016
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor Laser Mounting With Intact Diffusion Barrier Layer
- Publication number 20160028211
- Publication date Jan 28, 2016
- SPECTRASENSORS, INC.
- Alfred Feitisch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLLISIONAL BROADENING COMPENSATION USING REAL OR NEAR-REAL TIME VA...
- Publication number 20160011047
- Publication date Jan 14, 2016
- SPECTRASENSORS, INC.
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Application
REDUCED VOLUME SPECTROSCOPIC SAMPLE CELL
- Publication number 20150124257
- Publication date May 7, 2015
- SPECTRASENSORS, INC.
- Peter Scott
- G01 - MEASURING TESTING
Information Patent Application
Dynamic Reconstruction Of A Calibration State Of An Absorption Spec...
- Publication number 20140253922
- Publication date Sep 11, 2014
- SPECTRASENSORS, INC.
- Xiang Liu
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL REFLECTORS FOR SPECTROMETER GAS CELLS
- Publication number 20140160474
- Publication date Jun 12, 2014
- Lutz Keller
- G01 - MEASURING TESTING
Information Patent Application
SOLDERLESS MOUNTING FOR SEMICONDUCTOR LASERS
- Publication number 20140112363
- Publication date Apr 24, 2014
- Alfred Feitisch
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
COLLISIONAL BROADENING COMPENSATION USING REAL OR NEAR-REAL TIME VA...
- Publication number 20130250301
- Publication date Sep 26, 2013
- Alfred Feitisch
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR LASER MOUNTING WITH INTACT DIFFUSION BARRIER LAYER
- Publication number 20130044322
- Publication date Feb 21, 2013
- Alfred Feitisch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor Laser Mounting for Improved Frequency Stability
- Publication number 20120236893
- Publication date Sep 20, 2012
- Gabi Neubauer
- G01 - MEASURING TESTING
Information Patent Application
REACTIVE GAS DETECTION IN COMPLEX BACKGROUNDS
- Publication number 20120185179
- Publication date Jul 19, 2012
- Xin Zhou
- G01 - MEASURING TESTING

Alfred O. Feitisch

Person

Patents Grantslast 30 patents

Reconstruction of frequency registration for quantitative spectroscopy

Spectrometer with wide-scan tunable diode laser

Radiation shield for near-infrared detectors

Optical absorbance measurements with self-calibration and extended...

Target analyte detection and quantification in sample gases with co...

Spectrometer with active beam steering

Optical reflectors for spectrometer gas cells

Spectrometer with active beam steering

Semiconductor laser mounting with intact diffusion barrier layer

Determination and correction of frequency registration deviations f...

Reduced volume spectroscopic sample cell

Spectrometer optical head assembly

Spectrometer with variable beam power and shape

Spectrometer with random beam profiles

Optical absorbance measurements with self-calibration and extended...

Spectrometer with active beam steering

Semiconductor laser mounting with intact diffusion barrier layer

Determination and correction of frequency registration deviations f...

Solderless mounting for semiconductor lasers

Collisional broadening compensation using real or near-real time va...

Spectrometer with variable beam power and shape

Semiconductor laser mounting for improved frequency stability

Dynamic reconstruction of a calibration state of an absorption spec...

Solderless mounting for semiconductor lasers

Semiconductor laser mounting with intact diffusion barrier layer

Reduced volume spectroscopic sample cell

Collisional broadening compensation using real or near-real time va...

Validation and correction of spectrometer performance using a valid...

Optical reflectors for spectrometer gas cells

Dynamic reconstruction of a calibration state of an absorption spec...

Patents Applicationslast 30 patents

SPECTROMETER WITH WIDE-SCAN TUNABLE DIODE LASER

SEMICONDUCTOR LASER MOUNTING WITH INTACT DIFFUSION BARRIER LAYER

SPECTROMETER WITH ACTIVE BEAM STEERING

OPTICAL REFLECTORS FOR SPECTROMETER GAS CELLS

RADIATION SHIELD FOR NEAR-INFRARED DETECTORS

OPTICAL ABSORBANCE MEASUREMENTS WITH SELF-CALIBRATION AND EXTENDED...

SPECTROMETER WITH ACTIVE BEAM STEERING

DETERMINATION AND CORRECTION OF FREQUENCY REGISTRATION DEVIATIONS F...

SEMICONDUCTOR LASER MOUNTING WITH INTACT DIFFUSION BARRIER LAYER

SPECTROMETER WITH VARIABLE BEAM POWER AND SHAPE

RECONSTRUCTION OF FREQUENCY REGISTRATION FOR QUANTITATIVE SPECTROSCOPY

Spectrometer Optical Head Assembly

Determination and Correction of Frequency Registration Deviations f...

Spectrometer with Random Beam Profiles

REDUCED VOLUME SPECTROSCOPIC SAMPLE CELL

Target Analyte Detection and Quantification in Sample Gases With Co...

Solderless Mounting for Semiconductor Lasers

OPTICAL REFLECTORS FOR SPECTROMETER GAS CELLS

Spectrometer With Active Beam Steering

Spectrometer With Variable Beam Power and Shape

Semiconductor Laser Mounting With Intact Diffusion Barrier Layer

COLLISIONAL BROADENING COMPENSATION USING REAL OR NEAR-REAL TIME VA...

REDUCED VOLUME SPECTROSCOPIC SAMPLE CELL

Dynamic Reconstruction Of A Calibration State Of An Absorption Spec...

OPTICAL REFLECTORS FOR SPECTROMETER GAS CELLS

SOLDERLESS MOUNTING FOR SEMICONDUCTOR LASERS

COLLISIONAL BROADENING COMPENSATION USING REAL OR NEAR-REAL TIME VA...

SEMICONDUCTOR LASER MOUNTING WITH INTACT DIFFUSION BARRIER LAYER

Semiconductor Laser Mounting for Improved Frequency Stability

REACTIVE GAS DETECTION IN COMPLEX BACKGROUNDS