Algirdas J. Gruodis

Person

Wappinger Falls, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Parallel operation linear feedback shift register
- Patent number 5,412,665
- Issue date May 2, 1995
- International Business Machines Corporation
- Algirdas J. Gruodis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Per pin circuit test system having N-bit pin interface providing sp...
- Patent number 5,381,421
- Issue date Jan 10, 1995
- International Business Machines Corporation
- John E. Dickol
- G01 - MEASURING TESTING
Information Patent Grant
High resolution programmable pulse generator employing controllable...
- Patent number 5,376,849
- Issue date Dec 27, 1994
- International Business Machines Corporation
- John E. Dickol
- G01 - MEASURING TESTING
Information Patent Grant
Test pattern generator for testing embedded arrays
- Patent number 5,285,453
- Issue date Feb 8, 1994
- International Business Machines Corporation
- Algirdas J. Gruodis
- G01 - MEASURING TESTING
Information Patent Grant
Per-pin integrated circuit test system having n-bit interface
- Patent number 5,127,011
- Issue date Jun 30, 1992
- International Business Machines Corporation
- Michael L. Combs
- G01 - MEASURING TESTING
Information Patent Grant
Driver circuit for testing bi-directional transceiver semiconductor...
- Patent number 5,097,144
- Issue date Mar 17, 1992
- International Business Machines Corporation
- Albert Y. Chang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for reducing and maintaining constant overshoot in a high...
- Patent number 4,779,270
- Issue date Oct 18, 1988
- International Business Machines Corporation
- Algirdas J. Gruodis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Distributed pattern generator
- Patent number 4,639,919
- Issue date Jan 27, 1987
- International Business Machines Corporation
- Yi-Hua E. Chang
- G11 - INFORMATION STORAGE
Information Patent Grant
High-speed programmable timing generator
- Patent number 4,608,706
- Issue date Aug 26, 1986
- International Business Machines Corporation
- Yihua E. Chang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Integrated circuit layout utilizing separated active circuit and wi...
- Patent number T100501
- Issue date Apr 7, 1981
- John Balyoz
- 029 - Metal working
Information Patent Grant
High density semiconductor circuit layout
- Patent number 4,080,720
- Issue date Mar 28, 1978
- International Business Machines Corporation
- John Balyoz
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
High density semiconductor integrated circuit layout
- Patent number 4,032,962
- Issue date Jun 28, 1977
- IBM Corporation
- John Balyoz
- H03 - BASIC ELECTRONIC CIRCUITRY

Algirdas J. Gruodis

Person

Patents Grantslast 30 patents

Parallel operation linear feedback shift register

Per pin circuit test system having N-bit pin interface providing sp...

High resolution programmable pulse generator employing controllable...

Test pattern generator for testing embedded arrays

Per-pin integrated circuit test system having n-bit interface

Driver circuit for testing bi-directional transceiver semiconductor...

Apparatus for reducing and maintaining constant overshoot in a high...

Distributed pattern generator

High-speed programmable timing generator

Integrated circuit layout utilizing separated active circuit and wi...

High density semiconductor circuit layout

High density semiconductor integrated circuit layout