Ali Ersoz

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Brookfield, WI, US

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Patents Grantslast 30 patents

Information Patent Grant
Magnetic resonance imaging system and method
- Patent number 12,092,715
- Issue date Sep 17, 2024
- GE Precision Healthcare LLC
- Ali Ersoz
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for reducing colored noise in medical images us...
- Patent number 11,783,451
- Issue date Oct 10, 2023
- GE PRECISION HEALTHCARE LLC
- Daniel Litwiller
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Motion correction systems and methods of propeller magnetic resonan...
- Patent number 11,474,183
- Issue date Oct 18, 2022
- GE Precision Healthcare LLC
- Shaorong Chang
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for waveform optimization for oblique scans
- Patent number 10,996,299
- Issue date May 4, 2021
- General Electric Company
- Ali Ersoz
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for reduced shading and blurring in magnetic re...
- Patent number 10,928,473
- Issue date Feb 23, 2021
- General Electric Company
- Ajeetkumar Gaddipati
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for accelerated multi-contrast propeller
- Patent number 10,884,086
- Issue date Jan 5, 2021
- GE Precision Healthcare LLC
- Ali Ersoz
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MAGNETIC RESONANCE IMAGING SYSTEM AND METHOD
- Publication number 20240201298
- Publication date Jun 20, 2024
- GE Precision Healthcare LLC
- Ali Ersoz
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR REDUCING COLORED NOISE IN MEDICAL IMAGES US...
- Publication number 20210272240
- Publication date Sep 2, 2021
- GE Precision Healthcare LLC
- Daniel Litwiller
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHODS AND SYSTEMS FOR REDUCED SHADING AND BLURRING IN MAGNETIC RE...
- Publication number 20200088821
- Publication date Mar 19, 2020
- GENERAL ELECTRIC COMPANY
- Ajeetkumar Gaddipati
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR WAVEFORM OPTIMIZATION FOR OBLIQUE SCANS
- Publication number 20200064426
- Publication date Feb 27, 2020
- GENERAL ELECTRIC COMPANY
- Ali Ersoz
- G01 - MEASURING TESTING