Ali Muhtaroglu

Person

Hillsboro, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Per die temperature programming for thermally efficient integrated...
- Patent number 8,461,895
- Issue date Jun 11, 2013
- Intel Corporation
- Tawfik Arabi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Per die temperature programming for thermally efficient integrated...
- Patent number 8,044,697
- Issue date Oct 25, 2011
- Intel Corporation
- Tawfik Arabi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Per die voltage programming for energy efficient integrated circuit...
- Patent number 7,685,445
- Issue date Mar 23, 2010
- Intel Corporation
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatuses for validating AC I/O loopback tests using...
- Patent number 7,228,515
- Issue date Jun 5, 2007
- Intel Corporation
- Bruce Querbach
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for on-die voltage fluctuation detection
- Patent number 7,157,924
- Issue date Jan 2, 2007
- Intel Corporation
- Ali Muhtaroglu
- G01 - MEASURING TESTING
Information Patent Grant
Structural input levels testing using on-die levels generators
- Patent number 7,036,061
- Issue date Apr 25, 2006
- Intel Corporation
- Ali Muhtaroglu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for on-die voltage fluctuation detection
- Patent number 6,747,470
- Issue date Jun 8, 2004
- Intel Corporation
- Ali Muhtaroglu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PER DIE TEMPERATURE PROGRAMMING FOR THERMALLY EFFICIENT INTEGRATED...
- Publication number 20120133578
- Publication date May 31, 2012
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Per die temperature programming for thermally efficient integrated...
- Publication number 20080001634
- Publication date Jan 3, 2008
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Per die voltage programming for energy efficient integrated circuit...
- Publication number 20080001795
- Publication date Jan 3, 2008
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and apparatuses for validating AC I/O loopback tests using...
- Publication number 20050257185
- Publication date Nov 17, 2005
- Intel Corporation
- Bruce Querbach
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for on-die voltage fluctuation detection
- Publication number 20040085085
- Publication date May 6, 2004
- Ali Muhtaroglu
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for on-die voltage fluctuation detection
- Publication number 20030112027
- Publication date Jun 19, 2003
- Ali Muhtaroglu
- G01 - MEASURING TESTING
Information Patent Application
Structural input levels testing using on-die levels generators
- Publication number 20030046624
- Publication date Mar 6, 2003
- Ali Muhtaroglu
- G01 - MEASURING TESTING

Ali Muhtaroglu

Person

Patents Grantslast 30 patents

Per die temperature programming for thermally efficient integrated...

Per die temperature programming for thermally efficient integrated...

Per die voltage programming for energy efficient integrated circuit...

Methods and apparatuses for validating AC I/O loopback tests using...

Method and apparatus for on-die voltage fluctuation detection

Structural input levels testing using on-die levels generators

Method and apparatus for on-die voltage fluctuation detection

Patents Applicationslast 30 patents

PER DIE TEMPERATURE PROGRAMMING FOR THERMALLY EFFICIENT INTEGRATED...

Per die temperature programming for thermally efficient integrated...

Per die voltage programming for energy efficient integrated circuit...

Methods and apparatuses for validating AC I/O loopback tests using...

Method and apparatus for on-die voltage fluctuation detection

Method and apparatus for on-die voltage fluctuation detection

Structural input levels testing using on-die levels generators