Alireza Shahdoost Moghaddam

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Surface contour measurement
- Patent number 12,146,732
- Issue date Nov 19, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Slope, p-component and s-component measurement
- Patent number 12,146,830
- Issue date Nov 19, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Scanning micro profiler
- Patent number 12,147,033
- Issue date Nov 19, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G02 - OPTICS
Information Patent Grant
Angle independent optical surface inspector
- Patent number 12,130,243
- Issue date Oct 29, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Region prober optical inspector
- Patent number 11,988,615
- Issue date May 21, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Time domain multiplexed defect scanner
- Patent number 11,852,592
- Issue date Dec 26, 2023
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Time domain multiplexed defect scanner
- Patent number 11,733,173
- Issue date Aug 22, 2023
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Region prober optical inspector
- Patent number 11,255,796
- Issue date Feb 22, 2022
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Scattered radiation defect depth detection
- Patent number 10,767,977
- Issue date Sep 8, 2020
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Scattered radiation optical scanner
- Patent number 10,648,928
- Issue date May 12, 2020
- Lumina Instruments Inc.
- Steven W. Meeks
- G02 - OPTICS
Information Patent Grant
Phase retardance optical scanner
- Patent number 10,641,713
- Issue date May 5, 2020
- Lumina Instruments Inc.
- Steven W. Meeks
- G02 - OPTICS
Information Patent Grant
Method of detecting the thickness of thin film disks or wafers
- Patent number 6,882,437
- Issue date Apr 19, 2005
- KLA Tencor Technologies
- Alireza Shahdoost Moghaddam
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TIME DOMAIN MULTIPLEXED DEFECT SCANNER
- Publication number 20230341332
- Publication date Oct 26, 2023
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
SCANNING MICRO PROFILER
- Publication number 20220269071
- Publication date Aug 25, 2022
- Lumina Instruments
- Steven W. Meeks
- G02 - OPTICS
Information Patent Application
SURFACE CONTOUR MEASUREMENT
- Publication number 20220187057
- Publication date Jun 16, 2022
- Lumina Instruments
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
SLOPE, P-COMPONENT AND S-COMPONENT MEASUREMENT
- Publication number 20220187204
- Publication date Jun 16, 2022
- Lumina Instruments
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
ANGLE INDEPENDENT OPTICAL SURFACE INSPECTOR
- Publication number 20220187218
- Publication date Jun 16, 2022
- Steven W. Meeks
- G02 - OPTICS
Information Patent Application
REGION PROBER OPTICAL INSPECTOR
- Publication number 20220136982
- Publication date May 5, 2022
- Lumina Instruments
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
REGION PROBER OPTICAL INSPECTOR
- Publication number 20200319116
- Publication date Oct 8, 2020
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
SCATTERED RADIATION DEFECT DEPTH DETECTION
- Publication number 20200278192
- Publication date Sep 3, 2020
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting the thickness of thin film disks or wafers
- Publication number 20030197874
- Publication date Oct 23, 2003
- Alireza Shahdoost Moghaddam
- G01 - MEASURING TESTING

Alireza Shahdoost Moghaddam

Person

Patents Grantslast 30 patents

Surface contour measurement

Slope, p-component and s-component measurement

Scanning micro profiler

Angle independent optical surface inspector

Region prober optical inspector

Time domain multiplexed defect scanner

Time domain multiplexed defect scanner

Region prober optical inspector

Scattered radiation defect depth detection

Scattered radiation optical scanner

Phase retardance optical scanner

Method of detecting the thickness of thin film disks or wafers

Patents Applicationslast 30 patents

TIME DOMAIN MULTIPLEXED DEFECT SCANNER

SCANNING MICRO PROFILER

SURFACE CONTOUR MEASUREMENT

SLOPE, P-COMPONENT AND S-COMPONENT MEASUREMENT

ANGLE INDEPENDENT OPTICAL SURFACE INSPECTOR

REGION PROBER OPTICAL INSPECTOR

REGION PROBER OPTICAL INSPECTOR

SCATTERED RADIATION DEFECT DEPTH DETECTION

Method of detecting the thickness of thin film disks or wafers