Allan Rosencwaig

Person

Danville, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Modulated reflectance measurement system using UV probe
- Patent number 8,817,260
- Issue date Aug 26, 2014
- KLA-Tencor Corporation
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Grant
Modulated reflectance measurement system using UV probe
- Patent number 7,646,486
- Issue date Jan 12, 2010
- KLA-Tencor Corporation
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Grant
Modulated reflectance measurement system using UV probe
- Patent number 7,362,441
- Issue date Apr 22, 2008
- KLA-Tencor Corporation
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Grant
Beam profile complex reflectance system and method for thin film an...
- Patent number 7,286,243
- Issue date Oct 23, 2007
- Arist Instruments, Inc.
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Grant
Critical dimension analysis with simultaneous multiple angle of inc...
- Patent number 7,248,375
- Issue date Jul 24, 2007
- Therma-Wave, Inc.
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Grant
Modulated reflectance measurement system using UV probe
- Patent number 7,126,690
- Issue date Oct 24, 2006
- Therma-Wave, Inc.
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection equipment for semiconductor wafers with precleaning
- Patent number 7,068,370
- Issue date Jun 27, 2006
- Therma-Wave, Inc.
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Grant
Optical scatterometry of asymmetric lines and structures
- Patent number 7,061,627
- Issue date Jun 13, 2006
- Therma-Wave, Inc.
- Jon Opsal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Critical dimension analysis with simultaneous multiple angle of inc...
- Patent number 6,972,852
- Issue date Dec 6, 2005
- Therma-Wave, Inc.
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection equipment for semiconductor wafers with precleaning
- Patent number 6,930,771
- Issue date Aug 16, 2005
- Therma-Wave, Inc.
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Grant
Thin film optical measurement system and method with calibrating el...
- Patent number 6,922,244
- Issue date Jul 26, 2005
- Therma-Wave, Inc.
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring temperature and sample characteristics using a rotating...
- Patent number 6,894,781
- Issue date May 17, 2005
- Therma-Wave, Inc.
- Lanhua Wei
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of isolated and aperiodic structures with simultaneous mul...
- Patent number 6,842,259
- Issue date Jan 11, 2005
- Therma-Wave, Inc.
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Grant
Critical dimension analysis with simultaneous multiple angle of inc...
- Patent number 6,829,057
- Issue date Dec 7, 2004
- Therma-Wave, Inc.
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of isolated and aperiodic structures with simultaneous mul...
- Patent number 6,813,034
- Issue date Nov 2, 2004
- Therma-Wave, Inc.
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Grant
Method of monitoring the fabrication of thin film layers forming a...
- Patent number 6,781,692
- Issue date Aug 24, 2004
- Therma-Wave, Inc.
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for analyzing multi-layer thin film stacks on semiconductors
- Patent number 6,774,997
- Issue date Aug 10, 2004
- Therma-Wave, Inc.
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of thin films and barrier layers on patterned wafers wi...
- Patent number 6,754,305
- Issue date Jun 22, 2004
- Therma-Wave, Inc.
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection equipment for semiconductor wafers with precleaning
- Patent number 6,714,300
- Issue date Mar 30, 2004
- Therma-Wave, Inc.
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for analyzing samples using combined thermal wave and X-r...
- Patent number 6,678,349
- Issue date Jan 13, 2004
- Therma-Wave, Inc.
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Grant
Critical dimension analysis with simultaneous multiple angle of inc...
- Patent number 6,654,131
- Issue date Nov 25, 2003
- Therma-Wave, Inc.
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Grant
Combination thin-film stress and thickness measurement device
- Patent number 6,608,689
- Issue date Aug 19, 2003
- Therma-Wave, Inc.
- Lanhua Wei
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring temperature and sample characteristics using a rotating...
- Patent number 6,583,875
- Issue date Jun 24, 2003
- Therma-Wave, Inc.
- Lanhua Wei
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for analyzing multi-layer thin film stacks on semiconductors
- Patent number 6,567,213
- Issue date May 20, 2003
- Therma-Wave, Inc.
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for analyzing samples using combined thermal wave and X-r...
- Patent number 6,512,815
- Issue date Jan 28, 2003
- Therma-Wave, Inc.
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Grant
Critical dimension analysis with simultaneous multiple angle of inc...
- Patent number 6,429,943
- Issue date Aug 6, 2002
- Therma-Wave, Inc.
- Jon Opsal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus for analyzing multi-layer thin film stacks on semiconductors
- Patent number 6,417,921
- Issue date Jul 9, 2002
- Therma-Wave, Inc.
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for analyzing samples using combined thermal wave and X-r...
- Patent number 6,408,048
- Issue date Jun 18, 2002
- Therma-Wave, Inc.
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for analyzing multi-layer thin film stacks on semiconductors
- Patent number 6,297,880
- Issue date Oct 2, 2001
- Therma-Wave, Inc.
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for analyzing multi-layer thin film stacks on semiconductors
- Patent number 6,278,519
- Issue date Aug 21, 2001
- Therma-Wave, Inc.
- Allan Rosencwaig
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MODULATED REFLECTANCE MEASUREMENT SYSTEM USING UV PROBE
- Publication number 20100134785
- Publication date Jun 3, 2010
- KLA-Tencor Corp.
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL PICTURE FRAME DEVICE AND SYSTEM
- Publication number 20090316056
- Publication date Dec 24, 2009
- Allan Rosencwaig
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MODULATED REFLECTANCE MEASUREMENT SYSTEM USING UV PROBE
- Publication number 20080158565
- Publication date Jul 3, 2008
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL PICTURE FRAME DEVICE AND SYSTEM
- Publication number 20080143890
- Publication date Jun 19, 2008
- ARIS DISPLAYS, INC.
- Allan Rosencwaig
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
High-sensitivity surface detection system and method
- Publication number 20070229833
- Publication date Oct 4, 2007
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Application
Modulated reflectance measurement system using UV probe
- Publication number 20070008541
- Publication date Jan 11, 2007
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Application
Critical dimension analysis with simultaneous multiple angle of inc...
- Publication number 20060012803
- Publication date Jan 19, 2006
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Application
Beam profile complex reflectance system and method for thin film an...
- Publication number 20050248773
- Publication date Nov 10, 2005
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection equipment for semiconductor wafers with precleaning
- Publication number 20050231719
- Publication date Oct 20, 2005
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Application
Critical dimension analysis with simultaneous multiple angle of inc...
- Publication number 20050057760
- Publication date Mar 17, 2005
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Application
Optical scatterometry of asymmetric lines and structures
- Publication number 20050041258
- Publication date Feb 24, 2005
- Jon Opsal
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Thin film optical measurement system and method with calibrating el...
- Publication number 20040218180
- Publication date Nov 4, 2004
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Application
Analysis of isolated and aperiodic structures with simultaneous mul...
- Publication number 20040212810
- Publication date Oct 28, 2004
- Jon Opsal's
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Application
High-temperature superconductivity devices and methods
- Publication number 20040152599
- Publication date Aug 5, 2004
- Allan Rosencwaig
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Modulated reflectance measurement system using UV probe
- Publication number 20040104352
- Publication date Jun 3, 2004
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Application
Optical inspection equipment for semiconductor wafers with precleaning
- Publication number 20040100633
- Publication date May 27, 2004
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Application
Critical dimension analysis with simultaneous multiple angle of inc...
- Publication number 20040046968
- Publication date Mar 11, 2004
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Application
Monitoring temperature and sample characteristics using a rotating...
- Publication number 20030197864
- Publication date Oct 23, 2003
- Lanhua Wei
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for analyzing multi-layer thin film stacks on semiconductors
- Publication number 20030160959
- Publication date Aug 28, 2003
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Application
Analysis of isolated and aperiodic structures with simultaneous mul...
- Publication number 20030147086
- Publication date Aug 7, 2003
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for analyzing samples using combined thermal wave and X-r...
- Publication number 20030081725
- Publication date May 1, 2003
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for analyzing samples using combined thermal wave and X-r...
- Publication number 20020154736
- Publication date Oct 24, 2002
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for analyzing multi-layer thin film stacks on semiconductors
- Publication number 20020154302
- Publication date Oct 24, 2002
- Allan Rosencwaig
- G01 - MEASURING TESTING
Information Patent Application
Critical dimension analysis with simultaneous multiple angle of inc...
- Publication number 20020135783
- Publication date Sep 26, 2002
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for analyzing samples using combined thermal wave and x-r...
- Publication number 20020001364
- Publication date Jan 3, 2002
- Jon Opsal
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for analyzing multi-layer thin film stacks on semiconductors
- Publication number 20010033378
- Publication date Oct 25, 2001
- Allan Rosencwaig
- G01 - MEASURING TESTING

Allan Rosencwaig

Person

Patents Grantslast 30 patents

Modulated reflectance measurement system using UV probe

Modulated reflectance measurement system using UV probe

Modulated reflectance measurement system using UV probe

Beam profile complex reflectance system and method for thin film an...

Critical dimension analysis with simultaneous multiple angle of inc...

Modulated reflectance measurement system using UV probe

Optical inspection equipment for semiconductor wafers with precleaning

Optical scatterometry of asymmetric lines and structures

Critical dimension analysis with simultaneous multiple angle of inc...

Optical inspection equipment for semiconductor wafers with precleaning

Thin film optical measurement system and method with calibrating el...

Monitoring temperature and sample characteristics using a rotating...

Analysis of isolated and aperiodic structures with simultaneous mul...

Critical dimension analysis with simultaneous multiple angle of inc...

Analysis of isolated and aperiodic structures with simultaneous mul...

Method of monitoring the fabrication of thin film layers forming a...

Apparatus for analyzing multi-layer thin film stacks on semiconductors

Measurement of thin films and barrier layers on patterned wafers wi...

Optical inspection equipment for semiconductor wafers with precleaning

Apparatus for analyzing samples using combined thermal wave and X-r...

Critical dimension analysis with simultaneous multiple angle of inc...

Combination thin-film stress and thickness measurement device

Monitoring temperature and sample characteristics using a rotating...

Apparatus for analyzing multi-layer thin film stacks on semiconductors

Apparatus for analyzing samples using combined thermal wave and X-r...

Critical dimension analysis with simultaneous multiple angle of inc...

Apparatus for analyzing multi-layer thin film stacks on semiconductors

Apparatus for analyzing samples using combined thermal wave and X-r...

Apparatus for analyzing multi-layer thin film stacks on semiconductors

Apparatus for analyzing multi-layer thin film stacks on semiconductors

Patents Applicationslast 30 patents

MODULATED REFLECTANCE MEASUREMENT SYSTEM USING UV PROBE

DIGITAL PICTURE FRAME DEVICE AND SYSTEM

MODULATED REFLECTANCE MEASUREMENT SYSTEM USING UV PROBE

DIGITAL PICTURE FRAME DEVICE AND SYSTEM

High-sensitivity surface detection system and method

Modulated reflectance measurement system using UV probe

Critical dimension analysis with simultaneous multiple angle of inc...

Beam profile complex reflectance system and method for thin film an...

Optical inspection equipment for semiconductor wafers with precleaning

Critical dimension analysis with simultaneous multiple angle of inc...

Optical scatterometry of asymmetric lines and structures

Thin film optical measurement system and method with calibrating el...

Analysis of isolated and aperiodic structures with simultaneous mul...

High-temperature superconductivity devices and methods

Modulated reflectance measurement system using UV probe

Optical inspection equipment for semiconductor wafers with precleaning

Critical dimension analysis with simultaneous multiple angle of inc...

Monitoring temperature and sample characteristics using a rotating...

Apparatus for analyzing multi-layer thin film stacks on semiconductors

Analysis of isolated and aperiodic structures with simultaneous mul...

Apparatus for analyzing samples using combined thermal wave and X-r...

Apparatus for analyzing samples using combined thermal wave and X-r...

Apparatus for analyzing multi-layer thin film stacks on semiconductors

Critical dimension analysis with simultaneous multiple angle of inc...

Apparatus for analyzing samples using combined thermal wave and x-r...

Apparatus for analyzing multi-layer thin film stacks on semiconductors