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Allen H. Greenleaf
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Lexington, MA, US
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last 30 patents
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Patent Grant
Self calibrating contour measuring system using fringe counting int...
Patent number
4,457,625
Issue date
Jul 3, 1984
Itek Corporation
Allen H. Greenleaf
G01 - MEASURING TESTING
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Patent Grant
Position determining system
Patent number
3,936,632
Issue date
Feb 3, 1976
Itek Corporation
William C. Bradley
G01 - MEASURING TESTING