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Allen M. Carroll
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Berkeley, CA, US
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last 30 patents
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Patent Grant
Border modification for proximity effect correction in lithography
Patent number
6,436,607
Issue date
Aug 20, 2002
Applied Materials, Inc.
Richard L. Lozes
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Grant
Specimen distance measuring system
Patent number
4,788,431
Issue date
Nov 29, 1988
The Perkin-Elmer Corporation
William A. Eckes
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Virtual addressing for E-beam lithography
Patent number
4,498,010
Issue date
Feb 5, 1985
The Perkin-Elmer Corporation
Charles S. Biechler
B82 - NANO-TECHNOLOGY