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Allen S. Krieger
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Lexington, MA, US
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last 30 patents
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Patent Grant
X-ray detector suited for high energy applications with wide dynami...
Patent number
5,463,224
Issue date
Oct 31, 1995
American Science & Engineering, Inc.
Paul Burstein
G01 - MEASURING TESTING
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Patent Grant
Annular x-ray inspection system
Patent number
4,845,769
Issue date
Jul 4, 1989
American Science & Engineering, Inc.
Paul Burstein
G01 - MEASURING TESTING
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Patent Grant
High energy computed tomography
Patent number
4,691,332
Issue date
Sep 1, 1987
American Science & Engineering, Inc.
Paul Burstein
G01 - MEASURING TESTING
Information
Patent Grant
Soft x-ray spectrometric imaging system
Patent number
4,245,158
Issue date
Jan 13, 1981
American Science & Engineering, Inc.
Paul Burstein
G01 - MEASURING TESTING
Information
Patent Grant
X-ray lithography system having collimating optics
Patent number
4,242,588
Issue date
Dec 30, 1980
American Science & Engineering, Inc.
John K. Silk
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY