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Alon Belleli
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Gedera, IL
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last 30 patents
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Patent Grant
Optical method and system for defects detection in three-dimensiona...
Patent number
10,018,574
Issue date
Jul 10, 2018
Nova Measuring Instruments Ltd.
Gilad Barak
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Optical method and system for detecting defects in three-dimensiona...
Patent number
9,651,498
Issue date
May 16, 2017
Nova Measuring Instruments Ltd.
Gilad Barak
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
OPTICAL METHOD AND SYSTEM FOR DEFECTS DETECTION IN THREE-DIMENSIONA...
Publication number
20170138868
Publication date
May 18, 2017
NOVA MEASURING INSTRUMENTS LTD.
Gilad Barak
G01 - MEASURING TESTING
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Patent Application
OPTICAL METHOD AND SYSTEM FOR DETECTING DEFECTS IN THREE-DIMENSIONA...
Publication number
20150192527
Publication date
Jul 9, 2015
NOVA MEASURING INSTRUMENTS LTD.
Gilad Barak
G01 - MEASURING TESTING