Alon Litman

Person

Nes-Ziona, IL

People

Patents Grantslast 30 patents

Information Patent Grant
X-ray imaging in cross-section using un-cut lamella with background...
- Patent number 11,501,951
- Issue date Nov 15, 2022
- Applied Materials Israel Ltd.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detecting backscattered electrons in a multibeam charged particle c...
- Patent number 11,366,072
- Issue date Jun 21, 2022
- Applied Materials Israel Ltd.
- Jacob Levin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adaptive geometry for optimal focused ion beam etching
- Patent number 11,315,754
- Issue date Apr 26, 2022
- Applied Materials Israel Ltd.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Generating three dimensional information regarding structural eleme...
- Patent number 11,264,202
- Issue date Mar 1, 2022
- Applied Materials Israel Ltd.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Filling empty structures with deposition under high-energy SEM for...
- Patent number 10,903,044
- Issue date Jan 26, 2021
- Applied Materials Israel Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Retractable detector
- Patent number 10,714,305
- Issue date Jul 14, 2020
- Applied Materials Israel Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for scanning an object with an electron beam usin...
- Patent number 10,541,104
- Issue date Jan 21, 2020
- Applied Materials Israel Ltd.
- Uri Lev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Retractable detector
- Patent number 10,211,026
- Issue date Feb 19, 2019
- Applied Materials Israel Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection of a lithographic mask that is protected by a pellicle
- Patent number 10,156,785
- Issue date Dec 18, 2018
- Applied Materials Israel Ltd.
- Alon Litman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Multi mode systems with retractable detectors
- Patent number 10,074,513
- Issue date Sep 11, 2018
- Applied Materials Israel Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for electrical measurements of objects in a vacuumed environ...
- Patent number 9,958,501
- Issue date May 1, 2018
- APPLIEED MATERIALS ISRAEL LTD.
- Amir Wachs
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of regions of interest using an electron beam system
- Patent number 9,847,209
- Issue date Dec 19, 2017
- Applied Materials Israel Ltd.
- Benzion Sender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi mode system with a dispersion X-ray detector
- Patent number 9,818,577
- Issue date Nov 14, 2017
- Applied Materials Israel Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection of regions of interest using an electron beam system
- Patent number 9,805,911
- Issue date Oct 31, 2017
- Applied Materials Israel Ltd.
- Benzion Sender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for charging and imaging an object
- Patent number 9,666,412
- Issue date May 30, 2017
- Applied Materials Israel Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Imaging bottom of high aspect ratio holes
- Patent number 9,632,044
- Issue date Apr 25, 2017
- Applied Materials Isreal Ltd
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detecting open and short of conductors
- Patent number 9,470,751
- Issue date Oct 18, 2016
- Applied Materials Israel Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of regions of interest using an electron beam system
- Patent number 9,466,462
- Issue date Oct 11, 2016
- Applied Materials Israel Ltd.
- Benzion Sender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Determining a state of a high aspect ratio hole using measurement r...
- Patent number 9,448,253
- Issue date Sep 20, 2016
- Applied Materials Israel Ltd.
- Konstantin Chirko
- G01 - MEASURING TESTING
Information Patent Grant
Inspection of a lithographic mask that is protected by a pellicle
- Patent number 9,366,954
- Issue date Jun 14, 2016
- Applied Materials Israel Ltd.
- Alon Litman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for inspecting a sample using landing lens
- Patent number 9,297,692
- Issue date Mar 29, 2016
- Applied Materials Israel, Ltd.
- Yoram Uziel
- G01 - MEASURING TESTING
Information Patent Grant
System and method for compensating for magnetic noise
- Patent number 8,389,962
- Issue date Mar 5, 2013
- Applied Materials Israel, Ltd.
- Konstantine Chirko
- G01 - MEASURING TESTING
Information Patent Grant
Variable rate scanning in an electron microscope
- Patent number 8,207,499
- Issue date Jun 26, 2012
- Applied Materials Israel, Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,842,935
- Issue date Nov 30, 2010
- Applied Materials Israel, Ltd.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,521,700
- Issue date Apr 21, 2009
- Applied Materials, Israel, Ltd.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Spot grid array scanning system
- Patent number 7,468,506
- Issue date Dec 23, 2008
- Applied Materials, Israel, Ltd.
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Grant
Optical spot grid array scanning system
- Patent number 7,468,507
- Issue date Dec 23, 2008
- Applied Materials, Israel, Ltd.
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic chuck for wafer metrology and inspection equipment
- Patent number 7,430,104
- Issue date Sep 30, 2008
- Appiled Materials, Inc.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of scanning an object that includes multiple regions of int...
- Patent number 7,285,779
- Issue date Oct 23, 2007
- Applied Materials Israel, Ltd.
- Alon Litman
- G01 - MEASURING TESTING
Information Patent Grant
Raster frame beam system for electron beam lithography
- Patent number 7,098,468
- Issue date Aug 29, 2006
- Applied Materials, Inc.
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
MULTIPLE ELECTRON BEAM OPTICS
- Publication number 20240387140
- Publication date Nov 21, 2024
- APPLIED MATERIALS ISRAEL LTD.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY IMAGING IN CROSS-SECTION USING UN-CUT LAMELLA WITH BACKGROUND...
- Publication number 20220367146
- Publication date Nov 17, 2022
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GENERATING THREE DIMENSIONAL INFORMATION REGARDING STRUCTURAL ELEME...
- Publication number 20210358712
- Publication date Nov 18, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTING BACKSCATTERED ELECTRONS IN A MULTI-BEAM CHARGED PARTICLE...
- Publication number 20210341398
- Publication date Nov 4, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Jacob Levin
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE GEOMETRY FOR OPTIMAL FOCUSED ION BEAM ETCHING
- Publication number 20210335571
- Publication date Oct 28, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Ilya Blayvas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RETRACTABLE DETECTOR
- Publication number 20190189391
- Publication date Jun 20, 2019
- APPLIED MATERIALS ISRAEL LTD.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI MODE SYSTEM WITH A DISPERSION X-RAY DETECTOR
- Publication number 20180012728
- Publication date Jan 11, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI MODE SYSTEMS WITH RETRACTABLE DETECTORS
- Publication number 20170213696
- Publication date Jul 27, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI MODE SYSTEM WITH A DISPERSION X-RAY DETECTOR
- Publication number 20170213697
- Publication date Jul 27, 2017
- APPLIED MATERIALS ISRAEL LTD.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SCANNING AN OBJECT WITH AN ELECTRON BEAM
- Publication number 20170011883
- Publication date Jan 12, 2017
- APPLIED MATERIALS ISRAEL, LTD.
- Uri Lev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION OF REGIONS OF INTEREST USING AN ELECTRON BEAM SYSTEM
- Publication number 20160322195
- Publication date Nov 3, 2016
- APPLIED MATERIALS ISRAEL, LTD.
- Benzion Sender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION OF A LITHOGRAPHIC MASK THAT IS PROTECTED BY A PELLICLE
- Publication number 20160282714
- Publication date Sep 29, 2016
- APPLIED MATERIALS ISRAEL LTD.
- Alon Litman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DETERMINING A STATE OF A HIGH ASPECT RATIO HOLE USING MEASUREMENT R...
- Publication number 20150362524
- Publication date Dec 17, 2015
- APPLIED MATERIALS ISRAEL, LTD.
- Konstantin Chirko
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION OF REGIONS OF INTEREST USING AN ELECTRON BEAM SYSTEM
- Publication number 20150200071
- Publication date Jul 16, 2015
- APPLIED MATERIALS ISRAEL, LTD.
- Benzion Sender
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DETECTING OPEN AND SHORT OF CONDUCTORS
- Publication number 20150198648
- Publication date Jul 16, 2015
- APPLIED MATERIALS ISRAEL, LTD.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION OF A LITHOGRAPHIC MASK THAT IS PROTECTED BY A PELLICLE
- Publication number 20150028203
- Publication date Jan 29, 2015
- Applied Materials Israel, Ltd.
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR INSPECTING A SAMPLE USING LANDING LENS
- Publication number 20140231632
- Publication date Aug 21, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Yoram Uziel
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR COMPENSATING FOR MAGNETIC NOISE
- Publication number 20120305763
- Publication date Dec 6, 2012
- Konstantine Chirko
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE RATE SCANNING IN AN ELECTRON MICROSCOPE
- Publication number 20100072365
- Publication date Mar 25, 2010
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Application
Optical spot grid array scanning system
- Publication number 20070133077
- Publication date Jun 14, 2007
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Application
Spot grid array scanning system
- Publication number 20060261261
- Publication date Nov 23, 2006
- Steven R. Rogers
- G01 - MEASURING TESTING
Information Patent Application
Raster Frame Beam System For Electron Beam Lithography
- Publication number 20060243918
- Publication date Nov 2, 2006
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Raster Frame Beam System For Electron Beam Lithography
- Publication number 20060243922
- Publication date Nov 2, 2006
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods of scanning an object that includes multiple regions of int...
- Publication number 20050279936
- Publication date Dec 22, 2005
- Applied Materials Israel Ltd.
- Alon Litman
- G01 - MEASURING TESTING
Information Patent Application
Raster frame beam system for electron beam lithography
- Publication number 20050274911
- Publication date Dec 15, 2005
- Meir Aloni
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Electrostatic chuck for wafer metrology and inspection equipment
- Publication number 20040179323
- Publication date Sep 16, 2004
- Alon Litman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method for enhanced voltage contrast analysis
- Publication number 20040017212
- Publication date Jan 29, 2004
- Applied Materials Israel Ltd.
- Alon Litman
- G01 - MEASURING TESTING

Alon Litman

Person

Patents Grantslast 30 patents

X-ray imaging in cross-section using un-cut lamella with background...

Detecting backscattered electrons in a multibeam charged particle c...

Adaptive geometry for optimal focused ion beam etching

Generating three dimensional information regarding structural eleme...

Filling empty structures with deposition under high-energy SEM for...

Retractable detector

System and method for scanning an object with an electron beam usin...

Retractable detector

Inspection of a lithographic mask that is protected by a pellicle

Multi mode systems with retractable detectors

System for electrical measurements of objects in a vacuumed environ...

Inspection of regions of interest using an electron beam system

Multi mode system with a dispersion X-ray detector

Inspection of regions of interest using an electron beam system

Method for charging and imaging an object

Imaging bottom of high aspect ratio holes

Detecting open and short of conductors

Inspection of regions of interest using an electron beam system

Determining a state of a high aspect ratio hole using measurement r...

Inspection of a lithographic mask that is protected by a pellicle

System and method for inspecting a sample using landing lens

System and method for compensating for magnetic noise

Variable rate scanning in an electron microscope

Raster frame beam system for electron beam lithography

Raster frame beam system for electron beam lithography

Spot grid array scanning system

Optical spot grid array scanning system

Electrostatic chuck for wafer metrology and inspection equipment

Methods of scanning an object that includes multiple regions of int...

Raster frame beam system for electron beam lithography

Patents Applicationslast 30 patents

MULTIPLE ELECTRON BEAM OPTICS

X-RAY IMAGING IN CROSS-SECTION USING UN-CUT LAMELLA WITH BACKGROUND...

GENERATING THREE DIMENSIONAL INFORMATION REGARDING STRUCTURAL ELEME...

DETECTING BACKSCATTERED ELECTRONS IN A MULTI-BEAM CHARGED PARTICLE...

ADAPTIVE GEOMETRY FOR OPTIMAL FOCUSED ION BEAM ETCHING

RETRACTABLE DETECTOR

MULTI MODE SYSTEM WITH A DISPERSION X-RAY DETECTOR

MULTI MODE SYSTEMS WITH RETRACTABLE DETECTORS

MULTI MODE SYSTEM WITH A DISPERSION X-RAY DETECTOR

SYSTEM AND METHOD FOR SCANNING AN OBJECT WITH AN ELECTRON BEAM

INSPECTION OF REGIONS OF INTEREST USING AN ELECTRON BEAM SYSTEM

INSPECTION OF A LITHOGRAPHIC MASK THAT IS PROTECTED BY A PELLICLE

DETERMINING A STATE OF A HIGH ASPECT RATIO HOLE USING MEASUREMENT R...

INSPECTION OF REGIONS OF INTEREST USING AN ELECTRON BEAM SYSTEM

DETECTING OPEN AND SHORT OF CONDUCTORS

INSPECTION OF A LITHOGRAPHIC MASK THAT IS PROTECTED BY A PELLICLE

SYSTEM AND METHOD FOR INSPECTING A SAMPLE USING LANDING LENS

SYSTEM AND METHOD FOR COMPENSATING FOR MAGNETIC NOISE

VARIABLE RATE SCANNING IN AN ELECTRON MICROSCOPE

Optical spot grid array scanning system

Spot grid array scanning system

Raster Frame Beam System For Electron Beam Lithography

Raster Frame Beam System For Electron Beam Lithography

Methods of scanning an object that includes multiple regions of int...

Raster frame beam system for electron beam lithography

Electrostatic chuck for wafer metrology and inspection equipment

Apparatus and method for enhanced voltage contrast analysis