Alon Yagil

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for scatterometric single-wavelength measuremen...
- Patent number 11,454,894
- Issue date Sep 27, 2022
- KLA Corporation
- Alon Yagil
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR SUPPRESSION OF TOOL INDUCED SHIFT IN SCANNING...
- Publication number 20240167813
- Publication date May 23, 2024
- KLA Corporation
- Itay Gdor
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SCATTEROMETRIC SINGLE-WAVELENGTH MEASUREMEN...
- Publication number 20220082950
- Publication date Mar 17, 2022
- KLA Corporation
- Alon Yagil
- H01 - BASIC ELECTRIC ELEMENTS