Alper Ercan

Person

  • Stuttgart, DE

Patents Grantslast 30 patents

  • Information Patent Grant

    Time of flight sensor and method

    • Patent number 11,796,679
    • Issue date Oct 24, 2023
    • SONY SEMICONDUCTOR SOLUTIONS CORPORATION
    • Alper Ercan
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Imaging device and method

    • Patent number 11,726,207
    • Issue date Aug 15, 2023
    • SONY SEMICONDUCTOR SOLUTIONS CORPORATION
    • Alper Ercan
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electronic device, method and computer program

    • Patent number 11,681,026
    • Issue date Jun 20, 2023
    • SONY SEMICONDUCTOR SOLUTIONS CORPORATION
    • Qing Ding
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Electronic device and method

    • Patent number 11,520,020
    • Issue date Dec 6, 2022
    • SONY SEMICONDUCTOR SOLUTIONS CORPORATION
    • Qing Ding
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

  • Information Patent Application

    IMAGING DEVICE AND METHOD

    • Publication number 20210157005
    • Publication date May 27, 2021
    • Sony Semiconductor Solutions Corporation
    • Alper Ercan
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRONIC DEVICE, METHOD AND COMPUTER PROGRAM

    • Publication number 20200018833
    • Publication date Jan 16, 2020
    • Sony Semiconductor Solutions Corporation
    • Qing Ding
    • G01 - MEASURING TESTING
  • Information Patent Application

    TIME OF FLIGHT SENSOR AND METHOD

    • Publication number 20190369219
    • Publication date Dec 5, 2019
    • Sony Semiconductor Solutions Corporation
    • Alper Ercan
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRONIC DEVICE AND METHOD

    • Publication number 20190204446
    • Publication date Jul 4, 2019
    • Sony Semiconductor Solutions Corporation
    • Qing Ding
    • G01 - MEASURING TESTING