Alvin I. Chen

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method of bias temperature instability calculation and prediction f...
- Patent number 10,621,386
- Issue date Apr 14, 2020
- Cadence Design Systems, Inc.
- Alvin Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hot carrier circuit reliability simulation
- Patent number 7,835,890
- Issue date Nov 16, 2010
- Cadence Design Systems, Inc.
- Lifeng Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hot-carrier device degradation modeling and extraction methodologies
- Patent number 7,567,891
- Issue date Jul 28, 2009
- Cadence Design Systems, Inc.
- Zhihong Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hot carrier circuit reliability simulation
- Patent number 7,292,968
- Issue date Nov 6, 2007
- Cadence Design Systems, Inc.
- Lifeng Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hot-carrier reliability design rule checker
- Patent number 7,219,045
- Issue date May 15, 2007
- Cadence Design Systems, Inc.
- Lifeng Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hot carrier effect simulation for integrated circuits
- Patent number 6,278,964
- Issue date Aug 21, 2001
- Matsushita Electric Industrial Co., Ltd.
- Jingkun Fang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Hot-Carrier Device Degradation Modeling and Extraction Methodologies
- Publication number 20090299716
- Publication date Dec 3, 2009
- Zhihong Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Hot Carrier Circuit Reliability Simulation
- Publication number 20080027699
- Publication date Jan 31, 2008
- Lifeng Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Hot carrier circuit reliability simulation
- Publication number 20030055621
- Publication date Mar 20, 2003
- Lifeng Wu
- G06 - COMPUTING CALCULATING COUNTING