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Amandev SINGH
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Eindhoven, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Metrology apparatus
Patent number
11,300,889
Issue date
Apr 12, 2022
ASML Netherlands B.V.
Leon Paul Van Dijk
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of inspecting a substrate, metrology apparatus, and lithogra...
Patent number
10,534,274
Issue date
Jan 14, 2020
ASML Netherlands B.V.
Teunis Willem Tukker
G01 - MEASURING TESTING
Information
Patent Grant
Measurement system, lithographic system, and method of measuring a...
Patent number
10,437,159
Issue date
Oct 8, 2019
ASML Netherlands B.V.
Teunis Willem Tukker
G01 - MEASURING TESTING
Information
Patent Grant
Focus monitoring arrangement and inspection apparatus including suc...
Patent number
9,921,489
Issue date
Mar 20, 2018
ASML Netherlands B.V.
Amandev Singh
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method of measuring asymmetry, inspection apparatus, lithographic s...
Patent number
9,786,044
Issue date
Oct 10, 2017
ASML Netherlands B.V.
Andreas Fuchs
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Inspection apparatus and methods, methods of manufacturing devices
Patent number
9,753,379
Issue date
Sep 5, 2017
ASML Netherlands B.V.
Amandev Singh
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
METROLOGY APPARATUS
Publication number
20210165335
Publication date
Jun 3, 2021
ASML NETHERLANDS B.V.
Leon Paul VAN DIJK
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Measurement System, Lithographic System, and Method Of Measuring a...
Publication number
20180164699
Publication date
Jun 14, 2018
ASML NETHERLANDS B.V.
Teunis Willem TUKKER
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Method of Inspecting a Substrate, Metrology Apparatus, and Lithogra...
Publication number
20180107124
Publication date
Apr 19, 2018
ASML NETHERLANDS B.V.
Teunis Willem TUKKER
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MEASURING ASYMMETRY, INSPECTION APPARATUS, LITHOGRAPHIC S...
Publication number
20160180517
Publication date
Jun 23, 2016
ASML NETHERLANDS B.V.
Andreas FUCHS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Focus Monitoring Arrangement and Inspection Apparatus Including suc...
Publication number
20160097984
Publication date
Apr 7, 2016
ASML NETHERLANDS B.V.
Amandev SINGH
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
Inspection Apparatus and Methods, Methods of Manufacturing Devices
Publication number
20160011523
Publication date
Jan 14, 2016
ASML NETHERLANDS B.V.
Amandev SINGH
G01 - MEASURING TESTING