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Amelia Clara Muro
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Hollister, CA, US
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last 30 patents
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Patent Grant
Aggregated run-to-run process control for wafer yield optimization
Patent number
7,269,526
Issue date
Sep 11, 2007
Hitachi Global Storage Technologies Netherlands B.V.
Amelia Clara Muro
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Aggregated run-to-run process control for wafer yield optimization
Publication number
20060265162
Publication date
Nov 23, 2006
HITACHI GLOBAL STORAGE TECHNOLOGIES
Amelia Clara Muro
H01 - BASIC ELECTRIC ELEMENTS