Ami Chand

Person

Goleta, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Vertical embedded sensor and process of manufacturing thereof
- Patent number 9,389,244
- Issue date Jul 12, 2016
- Applied Nanostructures, Inc.
- Jeremy J. Goeckeritz
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Probe for a scanning probe microscope and method of manufacture
- Patent number 8,857,247
- Issue date Oct 14, 2014
- Bruker Nano, Inc.
- Kevin J. Kjoller
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe having integrated silicon tip with cantilever
- Patent number 8,828,243
- Issue date Sep 9, 2014
- Applied Nanostructures, Inc.
- Rakesh Poddar
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe devices
- Patent number 8,397,555
- Issue date Mar 19, 2013
- Applied Nanostructures, Inc.
- Ami Chand
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of forming semiconductor devices in wafer assembly
- Patent number 8,003,534
- Issue date Aug 23, 2011
- Applied Nanostructures, Inc.
- Ami Chand
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Scanning probe devices and methods for fabricating same
- Patent number 7,913,544
- Issue date Mar 29, 2011
- Applied Nanostructures, Inc.
- Ami Chand
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Semiconductor device in wafer assembly
- Patent number 7,884,445
- Issue date Feb 8, 2011
- Applied Nanostructures, Inc.
- Ami Chand
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Probes for use in scanning probe microscopes and methods of fabrica...
- Patent number 7,370,515
- Issue date May 13, 2008
- Veeco Instruments Inc.
- Nihat Okulan
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of manipulating a sample
- Patent number 7,334,460
- Issue date Feb 26, 2008
- Veeco Instruments, Inc.
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Grant
Methods of fabricating structures for characterizing tip shape of s...
- Patent number 7,210,330
- Issue date May 1, 2007
- Veeco Instruments, Inc.
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Grant
Methods of fabricating structures for characterizing tip shape of s...
- Patent number 7,096,711
- Issue date Aug 29, 2006
- Veeco Instruments Inc.
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for manipulating a sample
- Patent number 7,040,147
- Issue date May 9, 2006
- Veeco Instruments Inc.
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for manipulating a sample
- Patent number 6,862,921
- Issue date Mar 8, 2005
- Veeco Instruments Inc.
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Grant
Microfabrication of cantilevers using sacrificial templates
- Patent number 6,016,693
- Issue date Jan 25, 2000
- The Regents of the University of California
- Mario B. Viani
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
PROBE DEVICE FOR SCANNING PROBE MICROSCOPES AND METHOD OF MANUFACTU...
- Publication number 20170184631
- Publication date Jun 29, 2017
- APPLIED NANOSTRUCTURES, INC.
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Application
Vertical Embedded Sensor and Process of Manufacturing Thereof
- Publication number 20140338075
- Publication date Nov 13, 2014
- APPLIED NANOSTRUCTURES, INC.
- Jeremy J. Goeckeritz
- B82 - NANO-TECHNOLOGY
Information Patent Application
Scanning probe having integrated silicon tip with cantilever
- Publication number 20120060244
- Publication date Mar 8, 2012
- Applied NanoStructures, Inc.
- Rakesh Poddar
- G01 - MEASURING TESTING
Information Patent Application
Method of forming semiconductor devices in wafer assembly
- Publication number 20110092046
- Publication date Apr 21, 2011
- Applied NanoStructures, Inc.
- Ami Chand
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PROBE FOR A SCANNING PROBE MICROSCOPE AND METHOD OF MANUFACTURE
- Publication number 20080282819
- Publication date Nov 20, 2008
- Veeco Instruments Inc.
- Kevin J. Kjoller
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device in wafer assembly
- Publication number 20080116533
- Publication date May 22, 2008
- Applied NanoStructures, Inc.
- Ami Chand
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
PIEZORESISTIVE CANTILEVER BASED NANOFLOW AND VISCOSITY SENSOR FOR M...
- Publication number 20080011058
- Publication date Jan 17, 2008
- The Regents of the University of California
- Ratnesh Lal
- G01 - MEASURING TESTING
Information Patent Application
METHODS OF FABRICATING STRUCTURES FOR CHARACTERIZING TIP SHAPE OF S...
- Publication number 20060277972
- Publication date Dec 14, 2006
- Veeco Instruments Inc.
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF MANIPULATING A SAMPLE
- Publication number 20060243034
- Publication date Nov 2, 2006
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Application
Probe for a scanning probe microscope and method of manufacture
- Publication number 20060213289
- Publication date Sep 28, 2006
- Kevin J. Kjoller
- G01 - MEASURING TESTING
Information Patent Application
Probes for use in scanning probe microscopes and methods of fabrica...
- Publication number 20050279729
- Publication date Dec 22, 2005
- Veeco Instruments Inc.
- Nihat Okulan
- G01 - MEASURING TESTING
Information Patent Application
Methods of fabricating structures for characterizing tip shape of s...
- Publication number 20050252282
- Publication date Nov 17, 2005
- Veeco Instruments, Inc.
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for manipulating a sample
- Publication number 20050145021
- Publication date Jul 7, 2005
- Ami Chand
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for manipulating a sample
- Publication number 20020125427
- Publication date Sep 12, 2002
- Veeco Instruments Inc.
- Ami Chand
- B82 - NANO-TECHNOLOGY

Person

Patents Grantslast 30 patents

Vertical embedded sensor and process of manufacturing thereof

Probe for a scanning probe microscope and method of manufacture

Scanning probe having integrated silicon tip with cantilever

Scanning probe devices

Method of forming semiconductor devices in wafer assembly

Scanning probe devices and methods for fabricating same

Semiconductor device in wafer assembly

Probes for use in scanning probe microscopes and methods of fabrica...

Method and apparatus of manipulating a sample

Methods of fabricating structures for characterizing tip shape of s...

Methods of fabricating structures for characterizing tip shape of s...

Method and apparatus for manipulating a sample

Method and apparatus for manipulating a sample

Microfabrication of cantilevers using sacrificial templates

Patents Applicationslast 30 patents

PROBE DEVICE FOR SCANNING PROBE MICROSCOPES AND METHOD OF MANUFACTU...

Vertical Embedded Sensor and Process of Manufacturing Thereof

Scanning probe having integrated silicon tip with cantilever

Method of forming semiconductor devices in wafer assembly

PROBE FOR A SCANNING PROBE MICROSCOPE AND METHOD OF MANUFACTURE

Semiconductor device in wafer assembly

PIEZORESISTIVE CANTILEVER BASED NANOFLOW AND VISCOSITY SENSOR FOR M...

METHODS OF FABRICATING STRUCTURES FOR CHARACTERIZING TIP SHAPE OF S...

METHOD AND APPARATUS OF MANIPULATING A SAMPLE

Probe for a scanning probe microscope and method of manufacture

Probes for use in scanning probe microscopes and methods of fabrica...

Methods of fabricating structures for characterizing tip shape of s...

Method and apparatus for manipulating a sample

Method and apparatus for manipulating a sample