Amir Bar

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Santa Clara, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Inspection system including parallel imaging paths with multiple an...
- Patent number 10,429,319
- Issue date Oct 1, 2019
- KLA-Tencor Corporation
- Shiow-Hwei Hwang
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Inspection System Including Parallel Imaging Paths with Multiple an...
- Publication number 20140285657
- Publication date Sep 25, 2014
- KLA-Tencor Corporation
- Shiow-Hwei Hwang
- G01 - MEASURING TESTING