Amir Noy

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Kfar Mordehai, IL

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Patents Grantslast 30 patents

Information Patent Grant
Producing electrical circuit patterns using multi-population transf...
- Patent number 8,769,471
- Issue date Jul 1, 2014
- Orbotech Ltd.
- Amir Noy
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Automatic repair of electric circuits
- Patent number 8,290,239
- Issue date Oct 16, 2012
- Orbotech Ltd.
- Amir Noy
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Multi-modal imaging
- Patent number 8,144,973
- Issue date Mar 27, 2012
- Orbotech Ltd.
- Tamir Margalit
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting electrical circuits utilizing refl...
- Patent number 7,355,692
- Issue date Apr 8, 2008
- Orbotech Ltd.
- Amir Noy
- G01 - MEASURING TESTING
Information Patent Grant
Image searching defect detector
- Patent number 7,127,099
- Issue date Oct 24, 2006
- Orbotech Ltd.
- Amir Noy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for fabricating flat workpieces
- Patent number 6,822,734
- Issue date Nov 23, 2004
- Orbotech Ltd.
- Doron Eidelman
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AUTOMATIC REPAIR OF ELECTRIC CIRCUITS
- Publication number 20130037526
- Publication date Feb 14, 2013
- ORBOTECH LTD.
- Amir Noy
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PRODUCING ELECTRICAL CIRCUIT PATTERNS USING MULTI-POPULATION TRANSF...
- Publication number 20110155424
- Publication date Jun 30, 2011
- ORBOTECH LTD.
- Amir Noy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-MODAL IMAGING
- Publication number 20100245813
- Publication date Sep 30, 2010
- ORBOTECH LTD.
- Tamir MARGALIT
- G01 - MEASURING TESTING
Information Patent Application
Automatic repair of electric circuits
- Publication number 20070092128
- Publication date Apr 26, 2007
- ORBOTECH LTD.
- Amir Noy
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
System and method for inspecting electrical circuits utilizing refl...
- Publication number 20050195389
- Publication date Sep 8, 2005
- ORBOTECH LTD.
- Amir Noy
- G01 - MEASURING TESTING
Information Patent Application
Image searching defect detector
- Publication number 20020168099
- Publication date Nov 14, 2002
- ORBOTECH LTD.
- Amir Noy
- G01 - MEASURING TESTING