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Amir Sagiv
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Beit-Zayit, IL
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Patents Grants
last 30 patents
Information
Patent Grant
Near-field sensor height control
Patent number
10,060,736
Issue date
Aug 28, 2018
Appled Materials Israel Ltd.
Amir Moshe Sagiv
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for use of binary spatial filters
Patent number
9,470,637
Issue date
Oct 18, 2016
Applied Materials Israel, Ltd.
Shmuel Mangan
G01 - MEASURING TESTING
Information
Patent Grant
On-tool wavefront aberrations measurement system and method
Patent number
9,395,266
Issue date
Jul 19, 2016
Applied Materials Israel Ltd.
Boris Golberg
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for coherence reduction
Patent number
9,244,290
Issue date
Jan 26, 2016
Applied Materials Israel Ltd.
Roman Vander
G02 - OPTICS
Information
Patent Grant
Method and system for creation of binary spatial filters
Patent number
8,984,453
Issue date
Mar 17, 2015
Applied Materials Israel, Ltd.
Shmuel Mangan
G01 - MEASURING TESTING
Information
Patent Grant
System and method for evaluating error sources associated with a mask
Patent number
8,327,298
Issue date
Dec 4, 2012
Applied Materials Israel, Ltd.
Lev Faivishevsky
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and system for evaluating an object that has a repetitive pa...
Patent number
8,228,497
Issue date
Jul 24, 2012
Applied Materials Israel, Ltd.
Shmuel Mangan
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for aerial imaging of a reticle
Patent number
8,213,024
Issue date
Jul 3, 2012
Applied Materials Israel, Ltd.
Shmuel Mangan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ON-TOOL WAVEFRONT ABERRATIONS MEASUREMENT SYSTEM AND METHOD
Publication number
20150300913
Publication date
Oct 22, 2015
APPLIED MATERIALS ISRAEL LTD.
Boris Golberg
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR USE OF BINARY SPATIAL FILTERS
Publication number
20150233842
Publication date
Aug 20, 2015
APPLIED MATERIALS ISRAEL, LTD.
Shmuel Mangan
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR COHERENCE REDUCTION
Publication number
20140036942
Publication date
Feb 6, 2014
APPLIED MATERIALS ISRAEL LTD
Roman Vander
G02 - OPTICS
Information
Patent Application
METHOD AND SYSTEM FOR CREATION OF BINARY SPATIAL FILTERS
Publication number
20140007025
Publication date
Jan 2, 2014
Shmuel Mangan
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR EVALUATING ERROR SOURCES ASSOCIATED WITH A MASK
Publication number
20100235805
Publication date
Sep 16, 2010
Lev Faivishevsky
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Application
METHOD AND SYSTEM FOR EVALUATING AN OBJECT THAT HAS A REPETITIVE PA...
Publication number
20090066942
Publication date
Mar 12, 2009
Shmuel Mangan
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR DEFECT DETECTION
Publication number
20080074659
Publication date
Mar 27, 2008
Shmuel Mangan
G01 - MEASURING TESTING