Amir Shoham

Person

Nes Ziona, IL

People

Patents Grantslast 30 patents

Information Patent Grant
Optical inspection using controlled illumination and collection pol...
- Patent number 11,796,783
- Issue date Oct 24, 2023
- Applied Materials Israel Ltd.
- Elad Eizner
- G01 - MEASURING TESTING
Information Patent Grant
System and method for defect detection using multi-spot scanning
- Patent number 11,385,188
- Issue date Jul 12, 2022
- APPLIED MATERIAL ISRAEL, LTD.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection
- Patent number 11,105,740
- Issue date Aug 31, 2021
- Applied Materials Israel Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Computerized method for configuring an inspection system, computer...
- Patent number 11,029,253
- Issue date Jun 8, 2021
- Applied Materials Israel Ltd.
- Amir Shoham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for defect detection using multi-spot scanning
- Patent number 10,386,311
- Issue date Aug 20, 2019
- Applied Materials Israel, Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
System and method for defect detection using multi-spot scanning
- Patent number 9,810,643
- Issue date Nov 7, 2017
- Applied Materials Israel Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Detecting open and short of conductors
- Patent number 9,470,751
- Issue date Oct 18, 2016
- Applied Materials Israel Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Inspection having a segmented pupil
- Patent number 9,354,212
- Issue date May 31, 2016
- Applied Materials Israel Ltd.
- Yoav Berlatzky
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method and an inspection system exhibiting speckle reduc...
- Patent number 9,012,875
- Issue date Apr 21, 2015
- Applied Materials Israel, Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
Variable rate scanning in an electron microscope
- Patent number 8,207,499
- Issue date Jun 26, 2012
- Applied Materials Israel, Ltd.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Grant
System and method for producing a light beam with spatially varying...
- Patent number 7,764,426
- Issue date Jul 27, 2010
- Technion Research and Development Foundation Ltd.
- Stephen Geoffrey Lipson
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INSPECTION USING CONTROLLED ILLUMINATION AND COLLECTION POL...
- Publication number 20230417683
- Publication date Dec 28, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Elad Eizner
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION USING CONTROLLED ILLUMINATION AND COLLECTION POL...
- Publication number 20230117345
- Publication date Apr 20, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Elad Eizner
- G02 - OPTICS
Information Patent Application
OPTICAL INSPECTION
- Publication number 20210116368
- Publication date Apr 22, 2021
- APPLIED MATERIALS ISRAEL LTD.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Application
COMPUTERIZED METHOD FOR CONFIGURING AN INSPECTION SYSTEM, COMPUTER...
- Publication number 20180284031
- Publication date Oct 4, 2018
- APPLIED MATERIALS ISRAEL LTD.
- Amir Shoham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING OPEN AND SHORT OF CONDUCTORS
- Publication number 20150198648
- Publication date Jul 16, 2015
- APPLIED MATERIALS ISRAEL, LTD.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION HAVING A SEGMENTED PUPIL
- Publication number 20150193926
- Publication date Jul 9, 2015
- APPLIED MATERIALS ISRAEL, LTD.
- Yoav Berlatzky
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD AND AN INSPECTION SYSTEM EXHIBITING SPECKLE REDUC...
- Publication number 20140299790
- Publication date Oct 9, 2014
- APPLIED MATERIALS ISRAEL, LTD.
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE RATE SCANNING IN AN ELECTRON MICROSCOPE
- Publication number 20100072365
- Publication date Mar 25, 2010
- Amir Shoham
- G01 - MEASURING TESTING
Information Patent Application
System and method for producing a light beam with spatially varying...
- Publication number 20070183036
- Publication date Aug 9, 2007
- Stephen Geoffrey Lipson
- G02 - OPTICS

Amir Shoham

Person

Patents Grantslast 30 patents

Optical inspection using controlled illumination and collection pol...

System and method for defect detection using multi-spot scanning

Optical inspection

Computerized method for configuring an inspection system, computer...

System and method for defect detection using multi-spot scanning

System and method for defect detection using multi-spot scanning

Detecting open and short of conductors

Inspection having a segmented pupil

Inspection method and an inspection system exhibiting speckle reduc...

Variable rate scanning in an electron microscope

System and method for producing a light beam with spatially varying...

Patents Applicationslast 30 patents

OPTICAL INSPECTION USING CONTROLLED ILLUMINATION AND COLLECTION POL...

OPTICAL INSPECTION USING CONTROLLED ILLUMINATION AND COLLECTION POL...

OPTICAL INSPECTION

COMPUTERIZED METHOD FOR CONFIGURING AN INSPECTION SYSTEM, COMPUTER...

DETECTING OPEN AND SHORT OF CONDUCTORS

INSPECTION HAVING A SEGMENTED PUPIL

INSPECTION METHOD AND AN INSPECTION SYSTEM EXHIBITING SPECKLE REDUC...

VARIABLE RATE SCANNING IN AN ELECTRON MICROSCOPE

System and method for producing a light beam with spatially varying...