Amir Widmann

Person

Sunnyvale, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for creating or performing a dynamic sampling s...
- Patent number 10,649,447
- Issue date May 12, 2020
- KLA-Tencor Corp.
- Pavel Izikson
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and systems for creating or performing a dynamic sampling s...
- Patent number 9,651,943
- Issue date May 16, 2017
- KLA-Tencor Corp.
- Pavel Izikson
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for universal target based inspection and metrology
- Patent number 9,576,861
- Issue date Feb 21, 2017
- KLA-Tencor Corporation
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Feedforward/feedback litho process control of stress and overlay
- Patent number 9,116,442
- Issue date Aug 25, 2015
- KLA-Tencor Corporation
- Michael Adel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspecting a wafer and/or predicting one or more characteristics of...
- Patent number 8,948,495
- Issue date Feb 3, 2015
- KLA-Tencor Corp.
- Gino Marcuccilli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Unique mark and method to determine critical dimension uniformity a...
- Patent number 8,804,137
- Issue date Aug 12, 2014
- KLA-Tencor Corporation
- DongSub Choi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Advanced process control optimization
- Patent number 8,655,469
- Issue date Feb 18, 2014
- KLA-Tencor Corporation
- DongSub Choi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods and systems for creating or performing a dynamic sampling s...
- Patent number 8,175,831
- Issue date May 8, 2012
- KLA-Tencor Corp.
- Pavel Izikson
- G05 - CONTROLLING REGULATING
Information Patent Grant
Feedforward/feedback litho process control of stress and overlay
- Patent number 8,111,376
- Issue date Feb 7, 2012
- KLA-Tencor Corporation
- Michael Adel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Waferless recipe optimization
- Patent number 8,045,786
- Issue date Oct 25, 2011
- KLA-Tencor Technologies Corp.
- Amir Widmann
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Computer-implemented methods, carrier media, and systems for creati...
- Patent number 7,925,486
- Issue date Apr 12, 2011
- KLA-Tencor Technologies Corp.
- Mark Smith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for optimizing alignment performance in a fleet o...
- Patent number 7,679,069
- Issue date Mar 16, 2010
- KLA-Tencor Technologies Corporation
- Michael E. Adel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Techniques for determining overlay and critical dimension using a s...
- Patent number 7,561,282
- Issue date Jul 14, 2009
- KLA-Tencor Technologies Corporation
- Amir Widmann
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
Methods and Systems for Creating or Performing a Dynamic Sampling S...
- Publication number 20170255188
- Publication date Sep 7, 2017
- KLA-Tencor Corporation
- Pavel Izikson
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and System for Universal Target Based Inspection and Metrology
- Publication number 20140199791
- Publication date Jul 17, 2014
- KLA-Tencor Corporation
- Allen Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspecting a Wafer and/or Predicting One or More Characteristics of...
- Publication number 20140037187
- Publication date Feb 6, 2014
- Gino Marcuccilli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Creating or Performing a Dynamic Sampling S...
- Publication number 20120208301
- Publication date Aug 16, 2012
- KLA-Tencor Corporation
- Pavel Izikson
- G05 - CONTROLLING REGULATING
Information Patent Application
FEEDFORWARD/FEEDBACK LITHO PROCESS CONTROL OF STRESS AND OVERLAY
- Publication number 20120094400
- Publication date Apr 19, 2012
- KLA-Tencor Corporation
- Michael Adel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
ADVANCED PROCESS CONTROL OPTIMIZATION
- Publication number 20120022679
- Publication date Jan 26, 2012
- KLA-Tencor Corporation
- DongSub Choi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
UNIQUE MARK AND METHOD TO DETERMINE CRITICAL DIMENSION UNIFORMITY A...
- Publication number 20110051150
- Publication date Mar 3, 2011
- KLA-Tencor Corporation
- DongSub Choi
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
FEEDFORWARD/FEEDBACK LITHO PROCESS CONTROL OF STRESS AND OVERLAY
- Publication number 20080316442
- Publication date Dec 25, 2008
- KLA-Tencor Corporation
- Michael Adel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS AND SYSTEMS FOR CREATING OR PERFORMING A DYNAMIC SAMPLING S...
- Publication number 20080286885
- Publication date Nov 20, 2008
- Pavel Izikson
- G05 - CONTROLLING REGULATING
Information Patent Application
WAFERLESS RECIPE OPTIMIZATION
- Publication number 20080094639
- Publication date Apr 24, 2008
- KLA-Tencor Technologies Corporation
- Amir Widmann
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND SYSTEM FOR OPTIMIZING ALIGNMENT PERFORMANCE IN A FLEET O...
- Publication number 20080073589
- Publication date Mar 27, 2008
- KLA-Tencor Technologies Corporation
- Michael E. Adel
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COMPUTER-IMPLEMENTED METHODS, CARRIER MEDIA, AND SYSTEMS FOR CREATI...
- Publication number 20070276634
- Publication date Nov 29, 2007
- Mark Smith
- G06 - COMPUTING CALCULATING COUNTING

Amir Widmann

Person

Patents Grantslast 30 patents

Methods and systems for creating or performing a dynamic sampling s...

Methods and systems for creating or performing a dynamic sampling s...

Method and system for universal target based inspection and metrology

Feedforward/feedback litho process control of stress and overlay

Inspecting a wafer and/or predicting one or more characteristics of...

Unique mark and method to determine critical dimension uniformity a...

Advanced process control optimization

Methods and systems for creating or performing a dynamic sampling s...

Feedforward/feedback litho process control of stress and overlay

Waferless recipe optimization

Computer-implemented methods, carrier media, and systems for creati...

Method and system for optimizing alignment performance in a fleet o...

Techniques for determining overlay and critical dimension using a s...

Patents Applicationslast 30 patents

Methods and Systems for Creating or Performing a Dynamic Sampling S...

Method and System for Universal Target Based Inspection and Metrology

Inspecting a Wafer and/or Predicting One or More Characteristics of...

Methods and Systems for Creating or Performing a Dynamic Sampling S...

FEEDFORWARD/FEEDBACK LITHO PROCESS CONTROL OF STRESS AND OVERLAY

ADVANCED PROCESS CONTROL OPTIMIZATION

UNIQUE MARK AND METHOD TO DETERMINE CRITICAL DIMENSION UNIFORMITY A...

FEEDFORWARD/FEEDBACK LITHO PROCESS CONTROL OF STRESS AND OVERLAY

METHODS AND SYSTEMS FOR CREATING OR PERFORMING A DYNAMIC SAMPLING S...

WAFERLESS RECIPE OPTIMIZATION

METHOD AND SYSTEM FOR OPTIMIZING ALIGNMENT PERFORMANCE IN A FLEET O...

COMPUTER-IMPLEMENTED METHODS, CARRIER MEDIA, AND SYSTEMS FOR CREATI...