Amir Widmann

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D.N. Hof Hacarmel, IL

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Patents Grantslast 30 patents

Information Patent Grant
Material handling with dedicated automated material handling system
- Patent number 9,558,978
- Issue date Jan 31, 2017
- KLA-Tencor Corporation
- Amir Widmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for estimating and correcting misregistration target inaccuracy
- Patent number 9,329,033
- Issue date May 3, 2016
- KLA-Tencor Corporation
- Eran Amit
- G01 - MEASURING TESTING
Information Patent Grant
Inspection guided overlay metrology
- Patent number 9,170,209
- Issue date Oct 27, 2015
- KLA-Tencor Corporation
- Ellis Chang
- G01 - MEASURING TESTING
Information Patent Grant
Inspection guided overlay metrology
- Patent number 8,559,001
- Issue date Oct 15, 2013
- KLA-Tencor Corporation
- Ellis Chang
- G01 - MEASURING TESTING
Information Patent Grant
Iced film substrate cleaning
- Patent number 6,864,458
- Issue date Mar 8, 2005
- Applied Materials, Inc.
- Amir Widmann
- B08 - CLEANING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ESTIMATING AND CORRECTING MISREGISTRATION TARGET INACCURACY
- Publication number 20140060148
- Publication date Mar 6, 2014
- Eran Amit
- G01 - MEASURING TESTING
Information Patent Application
EFFICIENT MATERIAL HANDLING IN SEMICONDUCTOR WAFER PROCESSING
- Publication number 20130294871
- Publication date Nov 7, 2013
- KLA -TENCOR CORPORATION,
- AMIR WIDMANN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION GUIDED OVERLAY METROLOGY
- Publication number 20110170091
- Publication date Jul 14, 2011
- KLA-Tencor Corporation
- Ellis Chang
- G01 - MEASURING TESTING
Information Patent Application
ICED FILM SUBSTRATE CLEANING
- Publication number 20040140298
- Publication date Jul 22, 2004
- Applied Materials Israel Ltd.
- Amir Widmann
- B08 - CLEANING